Meetings/Workshops on Applied Physics: Microtechnology, Nanotechnology in Israel

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Meetings/Workshops on Applied Physics: Microtechnology, Nanotechnology in Israel

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1.	[ID=82082]Training Course — e-Beam Based Tools for Device/Materials Characterization (FIB-TEM)
	31 Aug 2008 → 11 Sep 2008; Haifa, Israel
	abstract: Implementation of dual-beam focused ion beam (FIB), basic electron and ion optics, electron/ion interaction with materials and EDS, and criteria for understanding images based on the various available signals and detectors. Hands-on experiments: HRSEM and FIB imaging, channeling contrast, localized electron/ion induced deposition, enhanced etching, cross-section SEM specimen preparation, H-bar TEM specimen preparation, and Lift-Out TEM specimen preparation. Six hours of lectures on FIB/SEM followed by 14 hours of hands-on training on the Technion dual beam FIB (Strata 400s). Transmission Electron Microscopy (TEM): basic electron optics and resolution; point resolution compared to the information limit, reciprocal space and electron diffraction, imaging by diffraction contrast (bright field, dark field, two-beam conditions), phase contrast (contrast transfer function, HRTEM, basic approaches to determining atomic positions, strain measurements), STEM (Z-contrast and EDS), and EFTEM (EELS, energy filters, interpretation of data). 24 hours of lecture followed by 26 hours of experiments on the Technion monochromated and aberration corrected FEG-TEM.
	weblink: http://www.prominas.eu/Training-Courses-TC-3.html
	related subject(s): Courses and Events for Physics Students; Multidisciplinary Events in Physics

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last updated: 22 September 2007

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Meetings/Workshops on Applied Physics: Microtechnology, Nanotechnology in Israel