Conference-Service.com stellt der Öffentlichkeit ein Kalendarium wichtiger Konferenzen, Symposien und sonstiger Tagungen im wissenschaftlich-technischen Bereich zur Verfügung.
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| 3. | [ID=138989]SISPAD 2008 — International Conference on Simulation of Semiconductor Processes and Devices |
| 09. Sep 2008 → 11. Sep 2008; Hakone, Japan |
| Veranstalter: Japan Society of Applied Physics; IEEE Electron Devices Society. |
| Themen: - Simulation and modeling based on continuum and/or particle methods for all sorts of devices including Fin, ultra-thin SOI, optoelectronics devices, lasers, TFTs, micro-sensors, spintronics devices and Carbon nanotubes. - Alll sorts of process simulation |
| Webseite: http://www6.eie.eng.osaka-u.ac.jp/sispad/2008/ |
| Kontakt: Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan |
| Verwandte Fachgebiete: Computerphysik und Numerische Simulation |
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| 4. | [ID=182387]2008 IEEE 22nd International Semiconductor Laser Conference (ISLC) |
| 15. Sep 2008 → 18. Sep 2008; Sorrento, Italien |
| Webseite: http://www.ieee.org/portal/site/leos/menuitem.c068a7b8deb7e828fb2275875bac26c8/index.jsp?&pName=leos_level1&path=leos/conf_list&file=conf_2008.xml&xsl=display_calendars.xsl |
| Verwandte Fachgebiete: Optik und Laser |
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| 5. | [ID=40473]ESSDERC/ESSCIRC 2008 — 38th European Solid-State Device Research Conference and 34th European Solid-State Circuits Conference |
| 15. Sep 2008 → 19. Sep 2008; EICC, Edinburgh, Großbritannien |
| Zusammenfassung: The aim of the ESSDERC conference is to provide an annual European forum for the presentation and discussion of recent advances in solid-state devices and technologies. ESSDERC and its sister conference ESSCIRC, which deals with solid-state circuits, are jointly organised. |
| Webseite: http://www.esscirc.org/EN/page/home.aspx |
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| 6. | [ID=182353]2008 5th IEEE International Conference on Group IV Photonics (GFP) |
| 17. Sep 2008 → 19. Sep 2008; Sorrento, Italien |
| Webseite: http://www.ieee.org/portal/site/leos/menuitem.c068a7b8deb7e828fb2275875bac26c8/index.jsp?&pName=leos_level1&path=leos/conf_list&file=conf_2008.xml&xsl=display_calendars.xsl#%C2%A0Sep. |
| Verwandte Fachgebiete: Angewandte Physik: Optoelektronik und Anzeigetechnik |
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| 7. | [ID=176411]THERMINIC 2008 — 14th International Workshop On Thermal Investigations Of ICs And Systems |
| 24. Sep 2008 → 26. Sep 2008; Rom, Italien |
| Zusammenfassung: THERMINIC Workshops are a series of events to discuss the essential thermal questions of microelectronic microstructures and electronic parts in general. |
| Webseite: http://cmp.imag.fr/conferences/therminic2008/ |
| Verwandte Fachgebiete: Angewandte Physik: Mikrotechnologie, Nanotechnologie |
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| 8. | [ID=111961]Single-Charge Effects in Semiconductor Nanostructures |
| 29. Sep 2008 → 01. Okt 2008; Bad Honnef, Deutschland |
| Webseite: http://www.pbh.de/tagungsprogramm/next_jahr/september.shtml |
| Verwandte Fachgebiete: Angewandte Physik: Mikrotechnologie, Nanotechnologie |
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| 9. | [ID=170131]OSC-08 — Organic Semiconductor Conference & Exhibition |
| 29. Sep 2008 → 01. Okt 2008; Frankfurt am Main, Deutschland |
| Veranstalter: cintelliq Limited |
| Webseite: http://www.osc-europe.com |
| Kontakt: Ms Anna Volund, cintelliq Limited St John's Innovation Centre Cowley Road Cambridge CB4 0WS United Kingdom; Tel.: (+44 1223 421525) |
| Verwandte Fachgebiete: Organische Chemie und Polymere |
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| 10. | [ID=133350]9th Annual LEDs |
| 29. Sep 2008 → 01. Okt 2008; San Diego, Kalifornien, Vereinigte Staaten |
| Webseite: http://www.intertechusa.com/conferences |
| Kontakt: IntertechPira, 19 Northbrook Drive, Portland, ME 04105 US ; Tel.: ((207) 781-9800) |
| Verwandte Fachgebiete: Angewandte Physik: Optoelektronik und Anzeigetechnik |
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| 11. | [ID=122841]RTP 2008 — 16th International Conference on Advanced Thermal Processing of Semiconductors |
| 30. Sep 2008 → 03. Okt 2008; Las Vegas, NV, Vereinigte Staaten |
| Webseite: http://www.ieee-rtp.org/ |
| Verwandte Fachgebiete: Computerhardware |
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| 12. | [ID=189339]PM08 — SPIE Photomask Technology 2008 |
| 05. Okt 2008 → 10. Okt 2008; Monterey, Kalifornien, Vereinigte Staaten |
| Zusammenfassung: The Annual SPIE/BACUS Symposium is the premier worldwide technical conference and exhibition for the photomask industry. This year's four-day symposium will give you the chance to engage with the most up-to-date research on emerging and on-going issues facing the photomask industry in advanced lithography and their manufacturing and data solutions. With the deep sub-wavelength era upon us, the industry's progress will depend on the successful integration and optimization of design, maskmaking, and wafer fabrication. |
| Webseite: http://spie.org/photomask.xml?WT.mc_id=RCALENDARW |
| Kontakt: SPIE, PO Box 10, Bellingham, WA 98227-0010 US ; Tel.: ((360) 676-3290); Email: customerservice@spie.org |
| Verwandte Fachgebiete: Optik und Laser; Angewandte Physik: Röntgen- und Synchrotronstrahlung, Kristallographie |
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| 13. | [ID=165723]Applications of High Powered Semiconductor Lasers |
| 06. Okt 2008 → 08. Okt 2008; San Diego, Kalifornien, Vereinigte Staaten |
| Zusammenfassung: AHPSL 2008 is a key event for the high-power semiconductor community to network with industry leaders, learn about the latest technologies and strategies and apply market data and case studies for established and emerging application areas to their own companies. |
| Webseite: http://www.ahpsl-conference.com/ |
| Kontakt: Mike Robert, IntertechPira, 19 Northbrook Drive, Portland, ME 04105 US ; Tel.: ((207) 781-9631) |
| Verwandte Fachgebiete: Optik und Laser |
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| 14. | [ID=38618]PM08 — SPIE Photomask Technology 28th Annual Symposium |
| 06. Okt 2008 → 10. Okt 2008; Monterey, California, Vereinigte Staaten |
| Veranstalter: SPIE |
| Zusammenfassung: The Annual SPIE/BACUS Symposium is the premier worldwide technical conference and exhibition for the photomask industry. This year's four-day symposium will give you the chance to engage with the most up-to-date research on emerging and on-going issues facing the photomask industry in advanced lithography and their manufacturing and data solutions. With the deep sub-wavelength era upon us, the industry's progress will depend on the successful integration and optimization of design, maskmaking, and wafer fabrication. |
| Webseite: http://spie.org/photomask.xml?WT.mc_id=RCALENDARW |
| Kontakt: Customer Service 1000 20th St Bellingham, WA 98225; Tel.: +1 360 676 3290; Email: customerservice@spie.org |
| Verwandte Fachgebiete: Angewandte Physik: Röntgen- und Synchrotronstrahlung, Kristallographie ; Angewandte Physik: Mikrotechnologie, Nanotechnologie |
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| 15. | [ID=175375]SMMO — International Conference on Semiconductor Materials and Optics |
| 09. Okt 2008 → 10. Okt 2008; Warschau, Polen |
| Themen: Physics and technology of novel semiconductor materials and devices, Intersubband transport and optics, Smart materials, New laser materials, Quantum optics, Medical materials and optics |
| Webseite: http://www.smmo.org/ |
| Verwandte Fachgebiete: Optik und Laser |
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| 16. | [ID=181541]CSICS — 2008 IEEE Compound Semiconductor Integrated Circuit Symposium |
| 12. Okt 2008 → 15. Okt 2008; Monterey, Kalifornien, Vereinigte Staaten |
| Webseite: http://www.csics.org |
| Verwandte Fachgebiete: Elektronik und Elektrotechnik |
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| 17. | [ID=109608]ASDAM 2008 — International Conference on Advanced Semiconductor Devices & Microsystems |
| 12. Okt 2008 → 16. Okt 2008; Smolenice, Slowakei |
| Webseite: http://www.ieee.org/portal/site/iportals |
| Verwandte Fachgebiete: Computerhardware |
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| 18. | [ID=41817]2008 IEEE Nuclear Science Symposium (NSS) And Medical Imaging Conference (MIC) And 16th International Workshop On Room-TemperatureSemiconductor X-Ray And Gamma-Ray Detectors (RTSD) |
| 18. Okt 2008 → 25. Okt 2008; Dresden, Deutschland |
| Webseite: http://www.nss-mic.org/2008/ |
| Verwandte Fachgebiete: Kernphysik; Nuklearmedizin und Radiologie |
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| 19. | [ID=153212]MFMN2008 — 7th International Conference on Materials for Microelectronics and Nanoengineering |
| 20. Okt 2008 → 22. Okt 2008; Maastricht, Niederlande |
| Zusammenfassung: An international conference reviewing growth, processing and materials developments in microelectronics and nanoengineering that target the next generation of e.g. devices, integrated circuits, sensors and display technologies The aim of MFMN is to encourage dialogue and discourse among engineers, materials scientists, physicists, etc. and to facilitate cross-fertilisation of ideas and concepts. A selection of papers from MFMN2008 will be included for publication in Journal of Materials Science: Materials in Electronics, published by Springer. The papers will be fully refereed via JMSE's regular review process. |
| Themen: Materials and Processes for Si and More-than-Moore Technology, New Semiconductor Materials & Devices, Design and Fabrication of Nanomaterials and Nanodevices, Characterisation Technologies, Nanoelectronics, Nanoelectromechanical Systems (NEMS) and Beyond, Chemical- and Bio-sensing Applications, Display Technology |
| Webseite: http://www.mfmn2008.euspen.eu/ |
| Verwandte Fachgebiete: Angewandte Physik: Mikrotechnologie, Nanotechnologie |
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| 20. | [ID=139049]PHYEM-08 — 3rd International Conference on Physics of Electronic Materials PHYEM?08 |
| 01. Nov 2008 → 04. Nov 2008; Kaluga, Russische Föderation |
| Themen: 1. General problems of modern physics of electronic materials. 2. Physical bases of growth of crystalline and amorphous materials, bulk and lower-dimensional substances and structures. 3. Physics of quasicrystals, clusters, fractals, etc. 4. Structure, defects and related phenomena (defect induced localized states, valence fluctuation, order-disorder processes, etc.). 5. Quantum and other unique effects (giant magnetoresistance, HTSC, metal-insulator transitions, etc.). 6. New materials and technologies including nanomaterials and nanotechnologies; new possibilities of electronic materials application. 7. Physical bases of electronic materials characterization. 8. The course of condensed matter physics in higher education. |
| Webseite: http://kspu.kaluga.ru/conf/phyem/ |
| Kontakt: PHYEM?08 Organizing Committee, K.Tsiolkovski State Pedagogical University, 26, Stepan Razin st., Kaluga 248023, Russia; Tel.: (+7-484 2 57 40 81 +) |
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| 21. | [ID=189282]TL08 — SPIE Lithography Asia 2008 - Taiwan |
| 04. Nov 2008; Taipei, Taiwan |
| Zusammenfassung: It is our great pleasure to invite you to attend the first SPIE Lithography Asia conference, featuring presentations from leading researchers, developers, and innovators. This is your opportunity to hear the latest research and connect with others working at the leading edge of semiconductor device technologies. |
| Webseite: http://spie.org/lithography-asia.xml?WT.mc_id=RCALENDARW |
| Kontakt: SPIE, PO Box 10, Bellingham, WA 98227-0010 US ; Tel.: ((360) 676-3290); Email: customerservice@spie.org |
| Verwandte Fachgebiete: Optik und Laser; Angewandte Physik: Röntgen- und Synchrotronstrahlung, Kristallographie |
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| 22. | [ID=109582]IWDTF 2008 — International Workshop on Dielectric Thin Films for Future ULSI Devices: Science and Technology |
| 05. Nov 2008 → 07. Nov 2008; Meguro-ku, Tokyo, Japan |
| Webseite: http://home.hiroshima-u.ac.jp/iwdtf/ |
| Verwandte Fachgebiete: Angewandte Physik; Angewandte Physik: Mikrotechnologie, Nanotechnologie |
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| 23. | [ID=188766] Symposium on Semiconductor Lasers and Luminescence in Nanostructures |
| 12. Nov 2008 → 14. Nov 2008; St. Petersburg, Russische Föderation |
| Webseite: http://www.ioffe.rssi.ru/evpti_08.html |
| Kontakt: Ioffe Physico-Technical Institute 26 Polytekhnicheskaya, St Petersburg 194021, Russian Federation; Tel.: (+7 812 297 2245) |
| Verwandte Fachgebiete: Optik und Laser; Angewandte Physik: Optoelektronik und Anzeigetechnik |
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| 24. | [ID=107246]Experimental Techniques in Semiconductor Research |
| 19. Nov 2008; Nottingham, Großbritannien |
| Webseite: http://www.iop.org/Conferences/Forthcoming_Institute_Conferences/index.html |
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| 25. | [ID=120217] International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors |
| 20. Nov 2008 → 24. Nov 2008; Dresden, Deutschland |
| Themen: Semiconductor Materials for Radiation Detection; Crystal Growth, Materials and Defects Characterization; Strip, Pixel and Discrete Semiconductor Detectors; Properties of Electrical Contacts and Device Technology; Radiation Damage, Long-Term Stability and Environmental Effects; Scintillator/Semiconductor Array Hybrids; Semiconductor Neutron Detectors; Detector/ASIC Hybridization, Interconnects and Electronics; Spectrometer Systems for Homeland Security, Nuclear Inspections Safeguards and Portal Monitoring; Imaging Systems for Medical, Astrophysics, Non-Destructive Testing and Cargo Monitoring Applications. |
| Webseite: http://www.nss-mic.org/2008/NSSMain.asp |
| Kontakt: RTSD Co-Chair, Freiburger Materialforschungszentrum, Stefan-Meier-Straße 21 79104 Freiburg , Germany; Tel.: (+49 (0) 761 203 4775) |
| Verwandte Fachgebiete: Messtechnik |
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| 26. | [ID=182371]SISC — 2008 IEEE 39th Semiconductor Interface Specialists Conference |
| 11. Dez 2008 → 13. Dez 2008; San Diego, Kalifornien, Vereinigte Staaten |
| Webseite: http://www.ieeesisc.org/ |
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| 27. | [ID=189374]AL09 — SPIE Advanced Lithography 2009 |
| 22. Feb 2009 → 27. Feb 2009; San Jose, Kalifornien, Vereinigte Staaten |
| Zusammenfassung: SPIE Advanced Lithography is the internationally recognized forum for reporting state-of-the-art research and development in optical lithography, resists, metrology, EUV, immersion, double patterning, DFM, and imprint lithography. Present your work: Many of the enabling technologies that ultimately drive R&D in the field of semiconductor microlithography derive from the research presented at the SPIE Advanced Lithography. Don't miss the opportunity to present your important research on topics such as EUV, smart metrology, resist materials, processing technology, and design to colleagues and industry leaders. Collaborate with your colleagues: Bringing important research to market, now more so than ever, depends on the collaborative effort of colleagues in different locations, often working in different disciplines. SPIE Advanced Lithography draws over 4,000 of the most talented researchers and managers working in the lithography industry. Join your colleagues and work together to bring your research forward. Keep abreast of Technology Changes through Courses + Training: Begin planning to extend your education at SPIE Advanced Lithography. Leading experts in the field will keep you and your team current on our fast-changing technologies. |
| Webseite: http://spie.org/advanced-lithography.xml?WT.mc_id=RCALENDARW |
| Kontakt: SPIE, PO Box 10, Bellingham, WA 98227-0010 US ; Tel.: ((360) 676-3290); Email: customerservice@spie.org |
| Verwandte Fachgebiete: Optik und Laser; Angewandte Physik: Optoelektronik und Anzeigetechnik |
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| 28. | [ID=82165]Training Course — Organic Electronics |
| 05. Jul 2009 → 16. Jul 2009; Haifa, Israel |
| Zusammenfassung: Aspects related to the operation and fabrication of organic devices. We will consider the main components that make up a flexible screen, the field effect transistor (the driver) and light emitting diodes. Most of the device fabrication and testing will be carried out in an integrated inert glovebox system. Use of atomic Force Microscopy (AFM) with soft materials and the information found in phase images of composites. |
| Themen: Organic Field Effect Transistors: Transport mechanisms in organic FETs. Discussion and explanations of device structure and fabrication. Different architectures and materials (top/bottom contact). Device preparation: organic solution; spin-casting and other necessary steps. Electrical measurements: measuring; displaying and analyzing results; extracting device parameters (avoiding artifacts). Organic Light Emitting Diodes: Discussion and explanations of device structure and fabrication. The role of the contact barrier (use of different contact metals). Current voltage analysis of LEDs in a space charge limited regime and in a contact limited regime. |
| Webseite: http://www.prominas.eu/Training-Courses-TC-2.html |
| Verwandte Fachgebiete: Kurse und Veranstaltungen für Physikstudenten |
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| 29. | [ID=71207]2009 NSREC — Nuclear and Space Radiation Effects Conference |
| 20. Jul 2009 → 24. Jul 2009; Quebec City, Kanada |
| Veranstalter: IEEE Radiation Effects Steering Group |
| Webseite: http://www.nsrec.com/steering.htm |
| Verwandte Fachgebiete: Festkörperphysik |
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| 30. | [ID=163133]NGC2009 & CSTC2009 — Nano and Giga Challenges in Electronics, Photonics and Renewable Energy & 14th Canadian Semiconductor Technology Conference |
| 10. Aug 2009 → 14. Aug 2009; Hamilton, Ontario, Kanada |
| Zusammenfassung: The NGC2009 & CSTC2009 forum in Canada invites academic and industrial researchers to present tutorial, expository and original research papers dedicated to solving scientific and technological problems in electronics, photonics and renewable energy such as atomic scale materials design, bio- and molecular electronics, high frequency electronics, fabrication of nanodevices; magnetic materials and spintronics; materials and processes for integrated and subwave optoelectronics, nanoCMOS, new materials for FETs and other devices, nanoelectronics system architecture, nano optics and lasers, non-silicon materials and devices, quantum effects in devices, nano science and technology applications in development of novel solar energy devices, and fuel cells and batteries. We also invite inventors, entrepreneurs and business leaders to explore the unique opportunity provided by our interdisciplinary forum for technical due diligence and potential commercialization of emerging new technologies. Sponsors and exhibitors are welcome and will be supported by the organizers in their needs for networking and marketing of their products and organizations. |
| Webseite: http://www.atomicscaledesign.net/ngc2009/ |
| Verwandte Fachgebiete: Angewandte Physik: Optoelektronik und Anzeigetechnik; Nichtnukleare Energieerzeugung |
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| 31. | [ID=82199]Training Course — Growth and Structural Characterization of Semiconductor Nanostructures (FIB-TEM) |
| 01. Sep 2009 → 14. Sep 2009; Grenoble, Frankreich |
| Zusammenfassung: Epitaxial growth of III-N compounds, Molecular Beam Epitaxy (MBE), X-Ray characterization using Synchrotron radiation (in particular grazing incidence diffraction, grazing incidence small angle X-Rays scattering (GISAXS) and Anomalous Diffraction), Characterization at the monolayer scale of deformation profile using MEIS (Medium energy ion scattering), Quantitative analysis of High Resolution Transmission Electron Microscopy (HRTEM) images, Raman spectroscopy of nanostructrures. The lectures will be followed by practical training in MBE, Xray diffraction and MEIS. |
| Webseite: http://www.prominas.eu/Training-Courses-TC-4.html |
| Verwandte Fachgebiete: Angewandte Physik: Mikrotechnologie, Nanotechnologie; Kurse und Veranstaltungen für Physikstudenten |
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| 32. | [ID=133491]SPIE Photomask Technology |
| 14. Sep 2009 → 18. Sep 2009; Monterey, Kalifornien, Vereinigte Staaten |
| Webseite: http://www.spie.org |
| Kontakt: SPIE, PO Box 10, Bellingham, WA 98227-0010 US ; Tel.: ((360) 676-3290) |
| Verwandte Fachgebiete: Angewandte Physik: Optoelektronik und Anzeigetechnik |
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| 33. | [ID=71249]2010 NSREC — Nuclear and Space Radiation Effects Conference |
| 19. Jul 2010 → 23. Jul 2010; Denver, CO, Vereinigte Staaten |
| Veranstalter: IEEE Radiation Effects Steering Group |
| Webseite: http://www.nsrec.com/steering.htm |
| Verwandte Fachgebiete: Festkörperphysik |
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Stand vom 01. August 2008