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| 2. | [ID=213471]EMMA Interest Group — Electromagnetics Materials Measurements & Applications (EMMA) Interest Group |
| 09 Dec 2008; Teddington, Royaume-Uni |
| Résumé: Aimed at those organisations and individuals interested in electromagnetic materials measurements on dielectric and magnetic materials, metamaterials and functional materials, and will provide a useful network and forum for the exchange of information, experience and best practice in these fields. This meeting has invited speakers to talk on recent work in the UK around electromagnetic materials measurements at frequencies from RF up to THz. The first meeting will focus on high frequency interests, but will include a workshop session to discuss the remit of the group. This may cover broader functionalities, e.g. piezoelectric actuation, magnetic tuning and dielectrophoresis. |
| Sujets: electromagnetics materials measurements, electromagnetics, dielectric, magnetic, metamaterials, functional materials |
| Page web: http://www.npl.co.uk/server.php?show=ConWebDoc.2914 |
| Sujets apparentés: Métrologie et instrumentation |
| 3. | [ID=215223]British Excellence in Composite Materials |
| 11 Dec 2008; London, Royaume-Uni |
| Organisateur: National Physical Laboratory |
| Résumé: This one-day conference and poster exhibition will demonstrate and celebrate the UK's strengths and capabilities in composites, bringing together active members of the UK composites community to showcase the best research at the forefront of UK composite technology. |
| Page web: http://www.npl.co.uk/server.php?show=nav.375 |
| Sujets apparentés: Chimie appliquée: Plastiques, peintures et matériaux synthétiques |
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| 4. | [ID=163300]ISSC — Interdisciplinary Surface Science Conference 17 |
| 30 Mar 2009 → 02 Avr 2009; Reading, Royaume-Uni |
| Organisateur: Thin Films and Surfaces Group of the Institute of Physics together with the Solid Surfaces Group of the Royal Society of Chemistry |
| Page web: http://physicsworld.com/cws/event/12987 |
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| 5. | [ID=175379]Dielectrics 2009 |
| 15 Avr 2009 → 17 Avr 2009; Reading, Royaume-Uni |
| Organisateur: The Dielectrics Group of the Institute of Physics |
| Page web: http://physicsworld.com/cws/event/13113 |
| Contact: Mr Jon Mackew, The Institute of Physics, 76 Portland Place, London, United Kingdom; Tél.: (+44 (0) 207 470 4984) |
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| 6. | [ID=158077]Materials Characterisation 2009 — Fourth International Conference on Computational Methods and Experiments in Materials Characterisation |
| 17 Jui 2009 → 19 Jui 2009; New Forest, Royaume-Uni |
| Organisateur: Wessex Institute of Technology |
| Résumé: The objective of this conference is to bring together researchers who use computational methods, those who perform experiments, and of course those who do both, in all areas of materials characterisation, to discuss their recent results and ideas, in order to foster the multidisciplinary approach that has become necessary for the study of complex phenomena. Topics of interest for this Conference range from generic characterisation methods to damage assessment and application to particular materials. |
| Page web: http://www.wessex.ac.uk/conferences/2009/index.html |
| Sujets apparentés: Physique numérique |
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| 7. | [ID=168620] 19th International Conference on Ion Beam Analysis |
| 07 Sep 2009 → 11 Sep 2009; Cambridge, Royaume-Uni |
| Sujets: Fundamentals of ion-solid interactions; Experimental developments and novel IBA techniques; Micro and nano Probes; Accelerator Mass Spectrometry; Computer Simulations and Analysis; Complementary use of IBA and other techniques of analysis; Facilities/Equipments. |
| Page web: http://www.iop.org |
| Contact: Institute of Physics, 76 Portland Place, London. W1B 1NT, UK; Tél.: (+44(0)20 7470 4800) |
| Sujets apparentés: Métrologie et instrumentation |
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| 8. | [ID=59439]SAS-2009 — XIV International Conference on Small-Angle Scattering |
| 13 Sep 2009 → 18 Sep 2009; Oxford, Royaume-Uni |
| Page web: http://www.isis.rl.ac.uk/largescale/loq/SAS2009/SAS2009.htm |
| Sujets apparentés: Physique appliquée: Rayonnement synchrotron et rayons X, cristallographie |
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