Services aux conférences Mandl

Résumé: This conference is aimed at bringing together research and technical personnel, from industry, governments, and especially academia, to foster cooperation to increase the utility of operational oceanographic assets to meet defense and homeland security concerns.

Résumé: The Novel Techniques in Microscopy Meeting aims at bringing together communities such as lighting, computer graphics, color technologists, optical designers, light sources and virtual reality towards the common goal of design, production and understanding of ambient lighting and a lit model's appearance.

Résumé: This five-day set of short courses on the two major electron spectroscopy techniques, Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS/ESCA) is designed for scientists, engineers, technicians, and students, who would like a detailed understanding of the uses of AES, XPS/ESCA, and Data Processing for surface analysis and depth profiling. The courses can be taken as a 5-day package or individually.

Résumé: Scanning microscopy for forensics, food analysis, medical applications, and health and safety.

Résumé: The Lehigh Microscopy School will be celebrating its 40th anniversary in June 2010. Considered to be the most comprehensive set of courses in electron and scanning probe microscopy in the world, the Lehigh Microscopy Schools have attracted more than 5,000 professionals from 50 states and 34 countries since its inception in 1970. During the two-week school, lecturers from the world’s leading research institutions and universities teach everything from basic to advanced microscopy. Course offerings include:

Scanning Electron Microscopy and X-ray Microanalysis (June 7-11)
Introduction to SEM and EDS for the New Operator (June 6)
Scanning Probe Microscopy: From Fundamentals to Advanced Applications (June 14-17)
Problem Solving with SEM, X-ray Microanalysis, and Electron Backscatter Patterns (June 14-18)
Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques (June 14-18)
Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications (June 14-17)
Focused Ion Beam (FIB): Instrumentation and Applications (June 14-17)

Résumé: This would be a first in a series of meetings focusing on specific topics in optical remote sensing of the environment. The first would address the coastal ocean and watersheds, with sessions emphasizing the inter-disciplinary nature of the topic. Sessions will cover the state of the art in instruments and methods for exploiting data from imaging spectrometers (hyperspectral/multi-spectral) and LIDAR. Sessions on specific topics such as bathymetry, coastal mapping, biophysical/geophysical retrieval (land and water), and atmospheric correction to name a few will be presented

Résumé: The proposed meeting will focus on advances in applied industrial optics. There will be three proposed topics: 1) Industrial Spectroscopy, 2)Industrial Imaging, and 3)Optical Metrology in Industry. Each topic will focus on applied technology that is currently utilized to enhance production, quality, and/or safety in an industrial setting. In addition, an attempt will be made to highlight current trends in applied optics that may have far reaching industrial implications. The meeting will draw from multiple industries to include: food & beverage, pharmaceutical, oil & gas, pulp & paper, chemical, biological, and defense. In addition, it is anticipated that the meeting attendance will be multidisciplinary

Résumé: NIWeek 2010, the 16th annual customer and technology conference, opens August 3 at the Austin Convention Center in Austin, Texas, for three days of interactive technical sessions, targeted summits, hands-on workshops, and exhibitions on the latest developments for design, control, automation, manufacturing, and test.