Meetings/Workshops on Metrology and Instrumentation in Canada
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The Electrochemical Society — 237th ECS Meeting with the 18th International Meeting on Chemical Sensors (IMCS 2020).
10 May 2020 - 15 May 2020 • Montreal, Canada
TIPP 2020 — International Conference on Technology and Instrumentation in Particle Physics
24 May 2020 - 29 May 2020 • Whistler BC, Canada
The TIPP conference series, the science driven cross-disciplinary conference, started in Tsukuba, Japan in 2009 (TIPP 2009), followed by Chicago in 2011 (TIPP 2011), Amsterdam in 2014 (TIPP2014) and Beijing in 2017 (TIPP2017). The conference aim is to provide a stimulating atmosphere for scientists and engineers from around the world. The 2020 edition will take place in Whistler (BC, Canada), a mountain resort less than 2 hours from Vancouver. This village-scale setting is expected to bring a workshop feel to the conference by facilitating interactions. The conference will, as in the past, include plenary invited talks and parallel tracks with contributions outlining state-of-the-art developments in different areas.
Accelerator-based particle physics, Non-accelerator particle physics and particle astrophysics, Experiments with synchrotron radiation and neutrons, Nuclear physics, Instrumentation and monitoring of particle and photon beams, Applications in photon science, biology, medicine, and engineering
IUMAS-8 — 8th Meeting of the International Union of Microbeam Analysis Societies
24 May 2021 - 28 May 2021 • Banff, Alberta, Canada
International Union of Microbeam Analysis Societies (IUMAS)
IUMAS was founded in 1994 to promote world-wide cooperation in all aspects of microbeam analysis through the organisation of an international congress on microbeam analysis every three to four years, and by participating in joint committee's with other scientific organisations in matters relevant to microbeam analysis which are better discussed on a world scale.
X-ray microanalysis | Advances in detectors | Cathodoluminescence | High-resolution microanalysis: STEM-EELS & -XEDS | EBSD | Atom probe microscopy | X-ray fluorescence & diffraction microanalysis | High-precision microanalysis: LA ICP-MS / SIMS Compositional imaging | FIB & related techniques | Correlative microscopy & microanalysis | Tomography | Low energy & advanced SEM techniques | Dynamic & in-situ EM | Scanning Transmission X-ray Microscopy | Microanalysis with synchrotron-based spectroscopy techniques
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Last updated: 08 January 2020