Konferenzen zum Thema Messtechnik in Polen

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1
XVIIth International Conference on Electron Microscopy
14. Jun 2020 - 17. Jun 2020 • Wisla, Polen
Veranstalter:
European Microbeam Analysis Society (MAS)
Zusammenfassung:
The XVIIth International Conference on Electron Microscopy (EM’2020), organised jointly by Silesian University of Technology and the Polish Society for Microscopy (PTMi), will provide a platform for electron microscopists, crystallographers, materials scientists, and solid state physicists to discuss methods and techniques used in electron microscopy. The scope of the EM’2020 is to provide a broad overview of the recent achievements in electron microscopy in the three major areas of instruments, methods, and application. The conference programme will include plenary lectures, oral and poster presentations covering both the fundamental, theory, instrumentations and applied research.
Themen:
Sample preparation techniques;• Scanning electron microscopy (SEM);• Advances in SEM and FIB;• Transmission electron microscopy (TEM);• HREM and novel techniques;• In situ microscopy;• Electron diffraction and crystallography;• Electron backscatter diffraction;
Eintrags-ID:
1314694
Verwandte Fachgebiete:
2
11th International ESA Conference on Guidance, Navigation & Control Systems
21. Jun 2020 - 26. Jun 2020 • Sopot, Polen
Veranstalter:
esa – European Space Agency
Zusammenfassung:
The Conference & Exhibition provide a major opportunity to promote GNC products & activities, meet potential customers, exchange ideas and encourage future cooperation. The Conference is addressed to international participants from the Aerospace Industry, Academia, Equipment Manufacturers and Space Agencies.
Eintrags-ID:
1300237
Verwandte Fachgebiete:
3
EM'2020 — XVIIth International Conference on Electron Microscopy
29. Nov 2020 - 02. Dez 2020 • Wisła, Polen
Veranstalter:
Silesian University of Technology and the Polish Society for Microscopy (PTMi)
Zusammenfassung:
The XVIIth International Conference on Electron Microscopy (EM’2020), organised jointly by Silesian University of Technology and the Polish Society for Microscopy (PTMi), will provide a platform for electron microscopists, crystallographers, materials scientists, and solid state physicists to discuss methods and techniques used in electron microscopy. The scope of the EM’2020 is to provide a broad overview of the recent achievements in electron microscopy in the three major areas of instruments, methods, and application. The conference programme will include plenary lectures, oral and poster presentations covering both the fundamental, theory, instrumentations and applied research.
Themen:
Sample preparation techniques; • Scanning electron microscopy (SEM); • Advances in SEM and FIB; • Transmission electron microscopy (TEM); • HREM and novel techniques; • In situ microscopy; • Electron diffraction and crystallography; • Electron backscatter diffraction
Eintrags-ID:
1357222
Verwandte Fachgebiete:


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Stand vom 21. Mai 2020