Conference Service Mandl

abstract: LEEM-PEEM is a biennial meeting reviewing the status of LEEM, PEEM, SPLEEM, XPEEM and related techniques. It aims at promoting and disseminating applications of cathode lens microscopy to a broad audience of interested scientists. The workshop will highlight the most recent scientific advances as well as instrumental developments. Topics will cover thin films, steps on surfaces, magnetism, time resolved LEEM/PEEM, surface science, nanostructures, two-photon photoemission, applications of XPEEM in biology, geology and medicine and other subject areas.

abstract: Multifunctional Nanomaterials Characterization Exploiting EllipsoMetry and Polarimetry

abstract: The quantitative determination of the properties of micro- and nano structures is essential in research and development and is a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements presuppose reliable and stable instruments, suitable measurement procedures as well as suitable calibration artefacts and methods.

abstract: Engineering Conferences International (ECI) is a not-for-profit global engineering conferences program, originally established in 1962, that provides opportunities for the exploration of problems and issues of concern to engineers and scientists from many disciplines.

The format of the conference provides morning and late afternoon or evening sessions in which major presentations are made. Poster sessions will be scheduled for discussion as well. Available time is included during the afternoons for ad hoc meetings, informal discussions, and/or recreation. This format is designed to enhance rapport among participants and promote dialogue on the development of the meeting. We believe the

abstract: On behalf of the Organizing Committee of the 7th IEEE SENSORS CONFERENCE 2008 it is a great honor and pleasure to welcome you to Lecce, Puglia, ITALY from October 26 to 29, 2008. IEEE SENSORS 2008 is the international conference for the presentation, discussion, and exchange of information regarding research and development in sensors and its related fields. IEEE SENSORS brings together researchers, developers, and practitioners from diverse fields, and the members of the Organizing Committee are making all efforts to meet your expectations, and to ensure a successful conference. We hope to create an opportunity for meeting old and making new friends and colleagues, and more importantly, to become acquainted with the latest developments in the sensors community. I cordially invite you to join us and to share your discoveries at IEEE SENSORS 2008, and I hope that you will take this opportunity to explore one of the most vibrant cities in the world. I look forward to meeting yo

abstract: This year’s theme is “Sustaining the Millennium Development Goals.”