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| 3. | [ID=352054]EWOFS 2010 — European Workshop on Optical Fibre Sensors |
| 07 Sep 2010 → 09 Sep 2010; Porto, Portugal |
| weblink: http://www.ewofs.org/ |
| related subject(s): Photonics, Optoelectronics and Display Devices |
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| 4. | [ID=250187]4th European Workshop on Optical Fibre Sensors |
| 08 Sep 2010 → 10 Sep 2010; Porto, Portugal |
| abstract: Following the successful Workshops in Peebles (1998), Santander (2004) and Napoli (2007) we at Porto have the privilege to organise the fourth edition of the European Workshop on Optical Fibre Sensors, EWOFS'2010. This initiative is aimed at promoting a scientific meeting with a high level of participants interaction that will enable the open debate and the assessment of new concepts, technologies and applications in the domain of optical fibre sensors, as well as the establishment of new collaborations and networks. EWOFS'2010 intends also to complement in time and geographical location the international conferences in this area, particularly the International Conference on Optical Fibre Sensors. |
| weblink: http://www.ewofs.org/ |
| contact: Jose Luis Santos |
| related subject(s): Photonics, Optoelectronics and Display Devices; Optics and Lasers |
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| 5. | [ID=341719]Theoretische Grundlagen, Instrumentation und Anwendungen der Schwingungsspektroskopie (Raman, Mittel-Infrarot und Nah-Infrarot) für die Materialwissenschaft |
| 14 Sep 2010 → 16 Sep 2010; Essen, Germany |
| abstract: Ziel der Veranstaltung ist die Erarbeitung der theoretischen und instrumentellen Grundlagen und der praktischen Anwendungsmöglichkeiten der modernen Schwingungsspektroskopie. Der Fokus auf “real-life“ Beispiele wird dabei helfen, die am besten geeignete der drei diskutierten Techniken für individuelle Probleme auszuwählen. Die Teilnahme an dem Kurs wird auch dazu befähigen, die Vor- und Nachteile der Schwingungsspektroskopie im Vergleich zu anderen analytischen Verfahren besser abzuschätzen und verfügbare schwingungsspektroskopische Daten effizienter auszuwerten. Inhalt: Der Kurs liefert einen Überblick über die theoretischen Grundlagen und den letzten Stand der Gerätetechnik (einschließlich Bildgebungsverfahren) für die Schwingungsspektroskopie (Raman, Mittel-Infrarot, Nah-Infrarot). Weiterhin wird ein breites Spektrum von Anwendungsbeispielen für die chemische und physikalische Analyse von Feststoffen, Flüssigkeiten und Gasen diskutiert. Probenpräparation und mögliche Artefakte (und deren Vermeidung) werden im Detail behandelt und die qualitative und quantitative Analyse werden sowohl für univariate als auch für multivariate, chemometrische Auswertealgorithmen besprochen. Die Behandlung praktischer Applikationen für die chemische, pharmazeutische, kosmetische, Polymer- und Lebensmittel-Industrie sowie für Umweltfragen wird die Relevanz dieser spektroskopischen Techniken für die Materialforschung sowie für die Qualitäts- und Reaktionskontrolle illustrieren. Zielgruppe: Chemiker, Physiker, Chemie-/Physik-Ingenieure und Labor-Techniker der chemischen, pharmazeutischen, Polymer- und Lebensmittel-Industrie Kursleitung: Prof. Dr. Heinz Wilhelm Siesler |
| weblink: http://www.gdch.de/vas/fortbildung/kurse/fortbildung2010.htm#2503 |
| contact: Gesellschaft Deutscher Chemiker e.V. Postfach 90 04 40 60444 Frankfurt am Main Deutschland; phone: (+49 69 7917-364/-291) |
| related subject(s): Condensed Matter Physics and Materials; Photochemistry and Spectroscopy |
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| 6. | [ID=324020]HP2.3: High Precision For Hard Processes At The LHC |
| 14 Sep 2010 → 17 Sep 2010; Florence, Italy |
| weblink: http://theory.fi.infn.it/HP23 |
| related subject(s): Particle Accelerators |
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| 7. | [ID=343989]IMC17 — International Microscopy Congress |
| 19 Sep 2010 → 24 Sep 2010; Rio de Janeiro, Brazil |
| abstract: The International Microscopy Congress (IMC) held every four years under the auspices of International Federation of Societies for Microscopy (IFSM) has been providing an international forum for the state of the art of microscopy at the frontiers of research and applications in Materials Sciences and in Life Sciences. The Brazilian Society for Microscopy and Microanalysis (SBMM) is proud and happy to host the IMC17. |
| weblink: http://www.imc-17.com/ |
| related subject(s): Microscopy |
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| 8. | [ID=311050]SPIE Remote Sensing 2010 |
| 20 Sep 2010 → 23 Sep 2010; Toulouse, France |
| abstract: The SPIE Remote Sensing Symposium has become the largest and most prestigious annual international meeting on this subject in Europe with more than 600 attendees and each year sees comprehensive coverage of scientific topics, applications, sensors, systems, and satellite platforms and more than 25 countries are represented. Co-located with the SPIE European Symposium on Defence & Security, this event will provide an excellent opportunity to explore new opportunities to collaborate with new partners from other related fields of activity. |
| weblink: http://spie.org/remote-sensing-europe.xml?WT.mc_id=Cal-ERS |
| contact: SPIE, PO Box 10, Bellingham, WA 98227 US ; phone: ((360) 676-3290) |
| related subject(s): Photonics, Optoelectronics and Display Devices |
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| 9. | [ID=354975]SRI 2010 — 16th Pan American Synchrotron Radiation Instrumentation Conference |
| 21 Sep 2010 → 24 Sep 2010; Chicago, IL, United States |
| topics: X-ray Facilities; New X-ray Sources; Beamline Instrumentation & Optics; Advanced X-ray Methods; Detector Development; Synchrotron Radiation Applications in: - Environmental & Earth Science - Energy - Biological & Life Science - Condensed Matter & Materials Science - Emerging Fields. |
| weblink: http://sri2010.aps.anl.gov/ |
| contact: Argonne National Laboratory, Advanced Photon Source |
| related subject(s): Applied Physics: X-rays, Synchrotron Radiation and Crystallography |
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| 10. | [ID=363085]Free ‘Inside Raman’ seminars |
| 22 Sep 2010 → 23 Sep 2010; Coventry, United Kingdom |
| abstract: University of Warwick to host ‘Inside Raman’ seminars An exciting line up of world-class speakers will be passing on their experience and expertise in the up-coming 'Inside Raman' event at the University of Warwick. This event, jointly organised by Renishaw plc and Mark Newton at the University of Warwick, is aimed at promoting Raman spectroscopy to UK businesses and academia. The event will appeal to anyone interested in learning about, or extending their understanding of Raman Spectroscopy, and will cater for people at all levels of Raman knowledge an experience. In addition to talks by prominent scientists on the application of Raman spectroscopy, the latest techniques, instrumentation and applications, research, and funding trends will be discussed. There will also be an opportunity to explore the impressive optical spectroscopy, NMR and electron resonance facilities at Millburn House. |
| weblink: http://www.renishaw.com/en/12700.aspx |
| related subject(s): Atomic and Molecular Physics; Photochemistry and Spectroscopy |
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| 11. | [ID=362973]XX International Symposium "Modern technologies, education and professional pratice in geodesy and related fields" |
| 23 Sep 2010 → 24 Sep 2010; Albena Resort, Bulgaria |
| abstract: The coming Symposium with an exhibition is the twentieth event in succession organized annually by the Union of Surveyors and Land Managers in Bulgaria, under the auspices and in close cooperation with eminent international geodetic and others organizations. |
| topics: geodesy, photogrammetry, cadastre and cartography, GNSS and GIS,related fields |
| weblink: http://cim.bg/index.php/en/view/organizing-xx-international-symposium-geodesy/ |
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| 12. | [ID=341636]Universelle Bearbeitung von Photoelektronenspektren (XPS, ESCA) für die quantitative Oberflächenanalyse - Einführungskurs für qualifizierte Mitarbeiter |
| 04 Oct 2010 → 05 Oct 2010; Leipzig, Germany |
| abstract: Ziel des Kurses ist die Vermittlung von Kenntnissen über die zuverlässige Oberflächen- und Dünnschichtanalyse mit Hilfe von Photoelektronenspektren. Es wird gezeigt, auf welche Weise spektrale Intensitätsverteilungen optimal bearbeitet, Steuer- und Bewertungsgrößen eines Peakfits richtig interpretiert und Spektrometerfunktionen korrekt berücksichtigt werden können. Ein Übungsprogramm soll Anwender mit der Verwendung von Datenbanken zur Identifizierung von chemischen Verschiebungen, mit der Serienbearbeitung von parameterabhängigen Messreihen, mit Datenexport, Grafikpräsentationen sowie mit einer praktischen Fehleranalyse vertraut machen. Inhalt: Schwerpunkte des Kurses sind: - Erklärung der spektralen Information - ESCA-Anwendungsbeispiele in der Materialanalyse - mathematische Modellierung der Photoelektronenspektren - Analyse und Diskussion von Fehlern des Peakfits - Einfluss der Spektrometer-Transmissionsfunktion - Übungen mit einer nutzerfreundlichen universellen Spektrenbearbeitungs-, Analyse- und Präsentationssoftware - Beratung zur Serienbearbeitung parameterabhängiger Messreihen, zu Datenexport und zur Ergebnispräsentation Zielgruppe: Anwender der Elektronenspektroskopie (Analytiker, Chemiker, Physiker, Ingenieure und Techniker) aus Forschungseinrichtungen und Industrielabors, die sich mit der quantitativen Analyse der Zusammensetzung und dem chemischen Zustand von Festkörperoberflächen und Dünnschichten befassen Kursleitung: Prof. Dr. Rüdiger Szargan |
| weblink: http://www.gdch.de/vas/fortbildung/kurse/fortbildung2010.htm#2363 |
| contact: Gesellschaft Deutscher Chemiker e.V. Postfach 90 04 40 60444 Frankfurt am Main Deutschland; phone: (+49 69 7917-364/-291) |
| related subject(s): Atomic and Molecular Physics; Condensed Matter Physics and Materials |
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| 13. | [ID=309636]REMOTE'10 — 6th WSEAS Int.Conf. on REMOTE SENSING |
| 04 Oct 2010 → 06 Oct 2010; Iwate Prefectural University , Japan |
| organizer: World Scientific and Engineering Academy and Society (WSEAS) |
| weblink: http://www.wseas.us/conferences/2010/japan/remote/ |
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| 14. | [ID=341577]Röntgenbeugung und Rietveldanalyse - Grundlagen und Anwendung in Industrie und Forschung |
| 04 Oct 2010 → 07 Oct 2010; Bremen, Germany |
| abstract: Die Rietveldmethode wird primär für quantitative Phasenanalysen und Kristallstrukturverfeinerungen eingesetzt, mit wachsendem Erfolg aber auch zur Bestimmung von Kristallitgrößen, Mikrospannungen und Stapelfehlordnungen. Ziel des Kurses ist es, dass Absolventen die Methode selbstständig anwenden und ihre Ergebnisse beurteilen können. Die notwendigen Grundlagen in Röntgenbeugung und Kristallographie werden im Kurs aufgefrischt. Ziel der großzügig anberaumten Übungen ist, einen sicheren Umgang mit der Rietveldsoftware zu erlernen und ihre Möglichkeiten und Grenzen auszuloten. Inhalt: Schwerpunkte des Kurses sind: - Vermeidung systematischer Fehler bei der Messung von Daten - Korrektur unvermeidbarer systematischer Fehler in den Daten - Auffrischung der erforderlichen kristallographischen und kristallchemischen Grundkenntnisse - Kristallstrukturmodelle, Reflexprofilmodelle und ihre Parameter - Parameteroptimierung und Verfeinerungsstrategie - Beurteilung von Verfeinerungsergebnissen - Bedienung der Rietveldsoftware - Phasen-Quantifizierung mit und ohne Strukturmodell und ihre Fallen - Kristallit- und Partikelgrößen, Mikroverzerrungen: Bestimmung und Bestimmungsgrenzen - Darstellung von Kristallstrukturen - Optional: Ergänzung von Kristallstrukturmodellen mit Fouriersynthesen - Großer Übungsteil, in dem bereitgestellte oder - nach vorheriger Rücksprache - eigene Daten bearbeitet werden können Zielgruppe: Praxisorientierter Einführungskurs für Chemiker, Pharmazeuten, Mineralogen, Geo- und Materialwissenschaftler in Industrie und Forschung Kursleitung: Dr. Johannes Birkenstock |
| weblink: http://www.gdch.de/vas/fortbildung/kurse/fortbildung2010.htm#2302 |
| contact: Gesellschaft Deutscher Chemiker e.V. Postfach 90 04 40 60444 Frankfurt am Main Deutschland; phone: (+49 69 7917-364/-291) |
| related subject(s): Applied Physics: X-rays, Synchrotron Radiation and Crystallography |
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| 15. | [ID=361989]9th International Symposium on Scanning Probe Microscopy & Optical Tweezers in Life Sciences |
| 06 Oct 2010 → 07 Oct 2010; Berlin, Germany |
| abstract: The event covers the applications of scanning probe microscopy (SPM) and optical tweezers technology to areas including biophysical, biochemical and medical research, stimulating fruitful discussions between the scientific communities of these complementary techniques. Leaders in the field together with novices are encouraged to learn from each other, discuss the presentations and share their experiences. |
| topics: spm, scanning probe microscopy, afm, atomic force microscopy, stm, scanning tunneling microscopy, optical tweezers, laser tweezers, biophysics, biochemistry, biomedicine, nanotechnology, nanobiotechnology, nanobiobiews, jpk |
| weblink: http://www.nanobioviews.net/spm-optical-tweezers.html |
| related subject(s): Biology; Microscopy |
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| 16. | [ID=362403]Workshop On Detector R And D |
| 07 Oct 2010 → 09 Oct 2010; Batavia, Illinois, United States |
| weblink: http://indico.fnal.gov/conferenceDisplay.py?confId=3356 |
| related subject(s): Particle Accelerators |
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| 17. | [ID=349289]CASSS: 12th Symposium on the Practical Applications for the Analysis of Proteins, Nucleotides and Small Molecules |
| 17 Oct 2010 → 21 Oct 2010; Vancouver, British Columbia, Canada |
| organizer: CASSS |
| weblink: http://www.casss.org/displaycommon.cfm?an=1&subarticlenbr=308 |
| contact: Renee Olson, Manager of Meetings and Events 5900 Hollis St. Suite R3 Emeryville CA 94608 Canada; phone: (510-428-0740) |
| related subject(s): Molecular Biology |
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| 18. | [ID=350537]2010 IEEE NSS/MIC/RTSD — 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors Workshop |
| 30 Oct 2010 → 06 Nov 2010; Knoxville, Tennessee, United States |
| abstract: The Nuclear Science Symposium (NSS) offers an outstanding opportunity for scientists and engineers interested or actively working in the fields of nuclear science, radiation instrumentation, software and their applications, to meet and discuss with colleagues from around the world. The program emphasizes the latest developments in technology and instrumentation and their implementation in experiments for space sciences, accelerators, other radiation environments, and homeland security. The Medical Imaging Conference (MIC) is the foremost international scientific meeting on the physics, engineering and mathematical aspects of nuclear medicine based imaging. As the field develops, multi-modality approaches are becoming more and more important. The content of the MIC reflects this, with a growing emphasis on the methodologies of X-ray, optical and MR imaging as they relate to nuclear imaging techniques. In addition, specialized topics will be addressed in the Short Courses and Workshops programs. The Workshop on Room-Temperature Semiconductor Detectors (RTSD) represents the largest forum of scientists and engineers developing new semiconductor radiation detectors and imaging arrays. Room-temperature solid-state radiation detectors for X-ray, gamma-ray, and neutron radiation are finding increasing applications in such diverse fields as medicine, homeland security, astrophysics and environmental remediation. The objective of this workshop is to provide a forum for discussion of the state of the art of material development for semiconductor, scintillator, and organic materials for detection, materials characterization, device fabrication and technology, electronics and applications. |
| topics: Nuclear Science, Medical Imaging, Room Temperature Semiconductor Detectors |
| weblink: http://www.nss-mic.org/2010 |
| related subject(s): Nuclear Physics; Applied Physics: Biophysics and Medical Physics |
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| 19. | [ID=351090]Optoelectronic Technologies for the Oil and Gas Industry |
| 04 Nov 2010; Aberdeen , United Kingdom |
| abstract: Optoelectronics technologies are increasingly being incorporated into oil and gas industry systems to generate and communicate the information required for production optimisation, enhanced oil recovery, extending field lifetimes and future intelligent oil field systems. Recent years has, for example, seen a major growth in the utilisation of optical fibres for subsea communications and downhole monitoring. Other areas in which optoelectronic technologies are being adopted include subsea inspection, leak detection, structural integrity and topside process monitoring. This second Optoelectronic Technologies For the Oil and Gas Industry technical meeting will address a broad range of optoelectronic technology developments relevant to current and future oil and gas industry applications. The ability of optoelectronics to facilitate real operational and commercial benefits as well as lessons learned will also be addressed. The breadth of optoelectronic technologies relevant to the oil and gas industry will be reflected in sessions covering optoelectronics for Downhole, Subsea and Surface applications. |
| weblink: http://www.optotechmeeting.com |
| related subject(s): Photonics, Optoelectronics and Display Devices; Petrochemistry |
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| 20. | [ID=355122] International Conference on Remote Sensing Remote 2010 |
| 06 Nov 2010 → 08 Nov 2010; Iwate, Japan |
| topics: Sensor design and calibration; Data acquisition and processing; Image processing, Pattern recognition, Photogrammetry, GIS; Defense and Security; Environmental Monitoring Concepts; Geological Applications and Climate; Urban Planning and Development; Remote Sensing for Energy and Environmental Systems. |
| weblink: http://www.wseas.us/conferences/2010/japan/remote/index.html |
| contact: Wessex Institute of Technology, Ashurst Lodge, Ashurst, Southampton SO40 7AA, UK |
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| 21. | [ID=360109]Metrology and Optical Testing |
| 08 Nov 2010 → 12 Nov 2010; Cranfield, United Kingdom |
| abstract: Cranfield University and Technium OpTIC (Opto-electronics Technology and Incubation Centre) offer this five day introductory short course in metrology and optical testing which aims to provide the basic science and practice behind the characterisation and measurement of functional surfaces, with a special focus on optical surfaces. |
| weblink: http://www.cranfield.ac.uk/sas/precisionengineering/ |
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| 22. | [ID=350069]ICMCE 2010 — 2010 International Conference on Measurement and Control Engineering |
| 16 Nov 2010 → 18 Nov 2010; Chengdu, China |
| abstract: The ICMCE 2010 conference proceeding will be published by IEEE CPS, which will be included in the IEEE Xplore, and indexed by the Ei Compendex, ISI Proceeding and other indexing services. |
| weblink: http://www.icmce.org/cfp.htm |
| related subject(s): Electronic Engineering |
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| 23. | [ID=343530]INSINUME 2010 — 5th International Symposium on In Situ Nuclear Metrology as a Tool for Radioecology |
| 20 Nov 2010 → 23 Nov 2010; Dubna, Russia |
| topics: New technologies and methodologies applied to measurements of radionuclides in situ and in the laboratory. Transfer of radionuclides in terrestrial and aquatic ecosystems; assessment of exposure to man and ecosystem Management of environmental crises related to nuclear accidents including social and economic aspects. Safety standards for radiation protection of the public and the environment; assessment and quality management. Development of national and international databases for their exchange among scientists and information to the general public. Mapping and modeling of radioactive contamination using GIS-technologies. Utilization of nuclear and non-nuclear wastes: new technologies, policy and legislation of the European Union. |
| weblink: http://insinume2010.jinr.ru/ |
| contact: INSINUME 2010, Joint Institute for Nuclear Research, Dubna Moscow Region 141980, Russian Federation; phone: (+74962165609) |
| related subject(s): Nuclear Physics |
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| 24. | [ID=354269]Hochfrequenz-Messtechnik |
| 06 Dec 2010 → 07 Dec 2010; Munich, Germany |
| organizer: Haus der Technik |
| abstract: Jeder, der heute drahtlose Systeme, also Mobilfunk-Komponenten, Datenfunk-Systeme uva. entwickeln oder fertigen und vor allem deren Funktion verifizieren will, benötigt Kenntnisse ü ber die gängigen Messverfahren. Diese Techniken gehen ü ber die bekannten einfachen Geräte wie Multimeter und Oszilloskop deutlich hinaus. Mit der Verfügbarkeit vieler und kostengünstiger drahtloser Mobilfunkkomponenten wie z.B. WLAN, Bluetooth, und auch GSM und UMTS hält die Hochfrequenztechnik Einzug in sehr viele Produkte des täglichen und beruflichen Alltags und macht auch vor alltäglichen Dingen wie Lichtschaltern nicht Halt. Damit ergibt sich die Notwendigkeit für sehr viele Elektroingenieure auch anderer Spezialisierungen Wissen um die HF-Messtechnik aufzufrischen oder neu zu erwerben. |
| topics: Leistungsmessung ,Blockschaltbild, Funktionsweise des Messgerätes, Varianten des Messgerätes, gepulster HF-Signale, Netzwerkanalyse, Netzwerkanalysator, Varianten des Messgerätes, vektorielle und skalare Analyse, Vierpolparameter (S-Parameter), Charakterisierung linearer Vierpole wie z.B. Verstärker und Filter, Fehlereinflüsse und ihre Beseitigung durch Kalibration, Spezialthemen, nichtlineare Baugruppen (Mischer), Spektrum- und Signalanalyse, Spektrumanalysator, elektromagnetische Spektrum, nichtlinearer Parameter (Mischer, Interzeptpunkte, nichtlineare Verzerrungen bei Verstärkern, Komplexe Modulationsverfahren und ihre Messung |
| weblink: http://www.hdt-essen.de/htd/veranstaltungen/W-H130-12-024-0.html?pattern=*oberschmidt* |
| related subject(s): Applied Physics: Electrostatics, Electromagnetic Waves; Electronic Engineering |
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| 25. | [ID=323002] 3rd Workshop on Precision Physics and Fundamental Physical Constants |
| 07 Dec 2010 → 10 Dec 2010; St. Petersburg, Russia |
| weblink: http://www.ioffe.rssi.ru/evpti_09.html |
| related subject(s): History and Philosophy of Physics |
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| 26. | [ID=362286]5th Symposium On Large TPCs For Low Energy Rare Event Detection |
| 14 Dec 2010 → 17 Dec 2010; Paris, France |
| weblink: http://www-tpc-paris.cea.fr/ |
| related subject(s): Particle Accelerators |
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| 27. | [ID=364299]ICNB 2010 — 2010 International Conference on Nanotechnology and Biosensors |
| 28 Dec 2010 → 30 Dec 2010; Hong Kong, China |
| abstract: 2010 International Conference on Nanotechnology and Biosensors, ICNB 2010, will be held during 28-30 December 2010, in Hong Kong. ICNB 2010, aims to bring together researchers, scientists, engineers, and scholar students to exchange and share their experiences, new ideas, and research results about all aspects of Nanotechnology and Biosensors, and discuss the practical challenges encountered and the solutions adopted. The conference will be held every year to make it an ideal platform for people to share views and experiences in Nanotechnology and Biosensors and related areas. The ICNB 2010 proceedings will be published by IEEE and All the papers will be archived in the IEEE Xplore and indexed by Ei Compendex and ISI. English is the official language of the conference. We welcome paper submissions. Prospective authors are invited to submit full (and original research) papers (which is NOT submitted/published/under consideration anywhere in other conferences/journal) in electronic (PDF only) format through the easy chair conferences management system website or via email icnb@cbees.org. |
| topics: Nanotechnology, Biosensors |
| weblink: http://www.icnb.org/ |
| related subject(s): Microtechnology, Nanotechnology |
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| 28. | [ID=362211]EDIT 2011 — Excellence In Detectors And Instrumentation Technologies |
| 31 Jan 2011 → 10 Feb 2011; CERN, Geneva, Switzerland |
| weblink: http://edit2011.web.cern.ch/edit2011/ |
| related subject(s): Particle Accelerators |
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| 29. | [ID=345277]Rutherford backscattering and related analytical techniques: from 1911 to 2011 |
| 07 Mar 2011 → 09 Mar 2011; Havana , Cuba |
| organizer: Cuban Physical Society |
| abstract: The symposium is planned to be an international meeting to celebrate the centennial of the famous Ernst Rutherford paper on the backscattering of alpha particles. In this context it is expected to encourage the exchange among researchers and professors of different countries in subjects related to Rutherford Backscattering (RBS) significance and applications. Plenary lectures as well as oral and poster communications will be organized. There will be also a school on Rutherford backscattering principles |
| weblink: http://www.fisica.uh.cu/scf/evento/index.htm |
| related subject(s): History and Philosophy of Physics |
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| 30. | [ID=346151]ISRSE 34 — 34th International Symposium for Remote Sensing of the Environment |
| 10 Apr 2011 → 15 Apr 2011; Sydney, Australia |
| abstract: This symposium provides a unique opportunity for remote sensing practitioners, scientists, system engineers and policy makers to share their knowledge and gain an excellent coverage of the current status of a range of remote sensing applications and developments now critical for the sustainability of the Earth’s environment. |
| topics: surveying, surveyor, spatial, science, land, development, urban, remote, sensing, planning, property, architect, forests, ecosystems, disaster, agriculture, water, coastal, data, infrastructure, information, wellbeing, climate change, atmosphere, earth |
| weblink: http://isrse34.org/ |
| related subject(s): Geophysics and Geology; Environmental Physics |
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| 31. | [ID=363438]SPIE Defense, Security, and Sensing 2011 |
| 25 Apr 2011 → 29 Apr 2011; Orlando, Florida, United States |
| abstract: Participate in conferences offering the latest sensing and related technologies for Industrial, Commercial, and Defense applications. Join attendees from more than 1,600 organizations—a cross section of the most important government agencies, universities, laboratories, and commercial organizations working in defense, security, and sensing. |
| topics: Sensor Systems, Sensor Platforms, IR, Radar, Passive Millimeter-wave, Terahertz Imaging, Spectroscopy, CBRNE, Persistent ISR, Acquisition and Tracking, C3I, Energy Harvesting, Biometric, Laser Sensors and Systems, Micro-Nanosensors, Biomimetics, Unmanned Systems, Robotic Systems, Layered Systems, Displays, Space Technologies, Space Operations, Sensors including Fiber Optics, Wireless Sensing, Scanning Microscopy, Sensor, Data Analysis, Image and Data Processing, Visual Analytics, Information Fusion, Target Recognition, Pattern Recognition, Synthetic Aperture, Vision Algorithms, Multi-Spectral Analysis, Hyper-Spectral Analysis, Ultra-Spectral Analysis, Situational Awareness, Information Systems and Networks, Sensor Systems and Networks |
| weblink: http://spie.org/defense-security.xml?WT.mc_id=RCal-DSSW |
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| 32. | [ID=364708]EOM11 — SPIE Optical Metrology 2011 |
| 22 May 2011 → 26 May 2011; Munich, Germany |
| abstract: The only conference in Europe to bring together scientists, engineers, researchers, and product developers engaged in optical metrology, art conservation, and multimedia. Co-located with Laser 2011 in Munich, Germany, this symposium addresses the role of lasers in the following areas: Optical Measurement Systems for Industrial Inspection, Modeling Aspects in Optical Metrology, O3A: Optics for Arts, Architecture, and Archaeology, Videometrics, Range Imaging and Applications |
| topics: Optical Measurement Systems, Industrial Inspection, Optical Metrology, Videometrics, Range Imaging |
| weblink: http://spie.org/optical-metrology-europe.xml?WT.mc_id=RCal-EOMW |
| related subject(s): Optics and Lasers |
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| 33. | [ID=355653]CMEM 2011 — 15th International Conference on Computational Methods and Experimental Measurements |
| 31 May 2011 → 02 Jun 2011; New Forest, United Kingdom |
| topics: Computational and experimental methods Computer interaction and control of experiments Direct, indirect and in-situ measurements Structural and stress analysis Sound and vibration Electrical and electromagnetic applications Fluid flow Industrial applications Composite materials Material characterisation Heat transfer and thermal processes Data acquisition and processing Data management Multiscale modelling Advances in instrumentation Nanoparticles. |
| weblink: http://www.wessex.ac.uk/11-conferences/cmem-2011.htm |
| contact: Wessex Institute of Technology, Ashurst Lodge, Ashurst, Southampton, SO40 7AA, UK; phone: (+44 (0) 238 0293223) |
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| 34. | [ID=362134]20th International Workshop On Vertex Detectors: Vertex 2011 |
| 19 Jun 2011 → 24 Jun 2011; Rust, Lake Neusiedl, Austria |
| weblink: http://vertex2011.hephy.at/ |
| related subject(s): Particle Accelerators |
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| 35. | [ID=333434]NDIP 2011 — 6th International Conference On New Developments In Photodetection |
| 04 Jul 2011 → 08 Jul 2011; Lyon, France |
| weblink: http://www.ndip.fr |
| related subject(s): Particle Accelerators |
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