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| 3. | [ID=296404]Moderne analytische Methoden der Röntgenspektroskopie |
| 22 Mar 2010 → 26 Mar 2010; Berlin, Allemagne |
| Résumé: Dieser einwöchige Kurs ist Teil einer Weiterbildung zur Instrumentellen Analytik, die sich das Ziel setzt, Hochschulabsolventen, Angestellte der Industrie und arbeitslose Akademiker mit den neuesten Möglichkeiten der modernen Analytik vertraut zu machen. Die voneinander unabhängigen Kurse vermitteln weiterbildende und vertiefende Kenntnisse zur Untersuchung und Charakterisierung komplexer Systeme. Die Weiterbildung richtet sich sowohl an Berufsanfänger und Berufstätige mit einem Abschluss in Chemie oder Physik, aber auch an Absolventen anderer Fachrichtungen, wie beispielsweise Materialwissenschaften. Eine Weiterbildung in instrumenteller Analytik verbreitert das Qualifikationsprofil und dient damit der Verbesserung der Beschäftigungsfähigkeit. Die einzelnen Kurse umfassen jeweils ein abgeschlossenes Themengebiet und bieten insgesamt ein breites, sich ergänzendes Spektrum an Themen zur umfassenden Weiterbildung in der Analytik für Chemiker und Physiker. Die aufeinander folgenden Termine der Kurse ermöglichen den Besuch mehrerer der angebotenen Kurse. Die Kurse umfassen neben einführenden Vorlesungen und Seminaren intensive Praktika und Übungen in Kleingruppen. Die Praktika finden in den Forschungslaboren der beteiligten Arbeitsgruppen statt. Schwerpunkte des Kurses: - allgemeine Einführung in analytische Methoden der Atom- und Molekülspektroskopie - Mikro-Röntgenfluoreszenzspektroskopie: Röntgenoptiken, SDD Detektoren, Spektrenaufnahme und Quantifizierung - 3D Mikro-Röntgenfluoreszenzspektroskopie: konfokaler Aufbau, Charakterisierung des Untersuchungsvolumens, Tiefenprofile, 3D „imaging“, Quantifizierung - Röntgenabsorptionsspektroskopie: chemische Speziation mit XANES und EXAFS, Grundbegriffe: Koordination, Oxidationsstufe, nächste Nachbarn - Praktika: Mikro-RFA und 3D Mikro-RFA Der Kurs wird von der Europäischen Union gefördert (Europäischer Sozialfonds). |
| Page web: http://www.ioap.tu-berlin.de/analytik |
| Contact: Technische Universität Berlin, Institut für Chemie, Sekr. TC9 Straße des 17. Juni 124 10623 Berlin Deutschland Herr Dr. Gerd Hauck; Tél.: (030-31422822) |
| Sujets apparentés: Chimie analytique; Physique appliquée: Rayonnement synchrotron et rayons X, cristallographie |
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| 4. | [ID=310718]Focus on Microscopy 2010 |
| 28 Mar 2010 → 31 Mar 2010; Shanghai, Chine |
| Résumé: Focus on Microscopy 2010 is the continuation of a yearly conference series presenting the latest innovations in optical microscopy and their application in biology, medicine and the material sciences. Key subjects for the conference series are the theory and practice of 3-D optical imaging, related 3-D image processing, and reporting especially on developments in resolution and imaging modalities. The conference series also covers the rapidly advancing fluorescence labeling techniques for the confocal and multiphoton 3-D imaging of live biological specimens. |
| Page web: http://www.focusonmicroscopy.org/ |
| Contact: Qiushi Ren, Inst. for Laser Medicine and Bio-Photonics, Shanghai Jiao Tong University, 800 Dongchuan Rd., Shanghai, 200240 China ; Tél.: (86 21 34204080) |
| Sujets apparentés: Opto-électronique et technique d'affichage; Microscopie |
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| 5. | [ID=288295]SPIE DSS Ocean Sensing and Monitoring II |
| 05 Avr 2010 → 09 Avr 2010; Orlando, Florida, États-Unis |
| Résumé: This conference is aimed at bringing together research and technical personnel, from industry, governments, and especially academia, to foster cooperation to increase the utility of operational oceanographic assets to meet defense and homeland security concerns. |
| Sujets: oceanography, underwater, imaging, remote sensing, ocean, marine, optics, acoustics, sensors, platforms, UUV, AUV, gliders, buoys, ship, sonar, observatory, circulation model, ocean forecasting |
| Page web: http://spie.org/ds211/ |
| Sujets apparentés: Océanographie |
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| 6. | [ID=315886]EMBO Practical Courses — Advanced optical microscopy 2010 |
| 08 Avr 2010 → 17 Avr 2010; Plymouth, Royaume-Uni |
| Organisateur: European Molecular Biology Organization |
| Page web: http://www.embo.org/myPhpFiles/calendar_ohnewas.php |
| Sujets apparentés: Biologie moléculaire; Microscopie |
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| 7. | [ID=309480]IMCAS'10 — 9th WSEAS Int. Conf. on INSTRUMENTATION, MEASUREMENT, CIRCUITS and SYSTEMS |
| 10 Avr 2010 → 12 Avr 2010; Hangzhou Supported By The China Asia Jiliang Unive, États-Unis |
| Organisateur: World Scientific and Engineering Academy and Society (WSEAS) |
| Page web: http://www.wseas.us/conferences/2010/hangzhou/imcas/ |
| Sujets apparentés: Électronique |
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| 8. | [ID=269842]Novel Techniques in Microscopy |
| 11 Avr 2010 → 15 Avr 2010; Miami, États-Unis |
| Résumé: The Novel Techniques in Microscopy Meeting aims at bringing together communities such as lighting, computer graphics, color technologists, optical designers, light sources and virtual reality towards the common goal of design, production and understanding of ambient lighting and a lit model's appearance. |
| Contact: OSA Customer Service; Mél.: custserv@osa.org |
| Sujets apparentés: Optique et lasers; Microscopie |
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| 9. | [ID=322337] 21st Workshop on Measurement Systems and Process Improvement |
| 19 Avr 2010 → 20 Avr 2010; Teddington, Royaume-Uni |
| Organisateur: National Physical Laboratory, Teddington, UK National Physical Laboratory and ISRU, Newcastle University |
| Sujets: Measurement systems analysis; Conformance assessment; Standards for measurement uncertainty evaluation; Coordination of measuring systems and process control; Measurement assisted assembly. |
| Page web: http://conferences.npl.co.uk/mspi |
| Contact: National Physical Laboratory, Hampton Road, Teddington, UK, TW11 0LW, UK; Tél.: (+44 20 8943 6348) |
| Sujets apparentés: Ingénierie |
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| 10. | [ID=206491]CAFMET 2010 — Third International Metrology Conference in Africa |
| 19 Avr 2010 → 23 Avr 2010; Le Caire, Égypte |
| Résumé: This Third international conference on metrology CAFMET 2010 in Africa, organized by The African Committee of Metrology, will be a forum for industrials and scientists to exchange information, ideas and experiences. The conferences, tutorials, presentations, material exhibitions and technical visits to firms have common objectives : To promote communication between manufacturers, governmental agencies, universities, institutes of higher education and laboratories dedicated to research and development in the field of measurement ; To present the evolution of metrology and its implications in industry, quality, environment, safety and research. |
| Page web: http://www.ac-metrology.com/ |
| Contact: Mél.: cafmet@ac-metrology.com |
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| 11. | [ID=297586]Surface Analysis comprehensive short courses |
| 19 Avr 2010 → 23 Avr 2010; Dayton, Ohio, États-Unis |
| Résumé: This five-day set of short courses on the two major electron spectroscopy techniques, Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS/ESCA) is designed for scientists, engineers, technicians, and students, who would like a detailed understanding of the uses of AES, XPS/ESCA, and Data Processing for surface analysis and depth profiling. The courses can be taken as a 5-day package or individually. |
| Page web: http://www.surfaceanalysis.org/schedule.html |
| Sujets apparentés: Physique de la matière condensée et des matériaux |
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| 12. | [ID=332225]VIPS 2010 — Workshop on Vertically Integrated Pixel Sensors |
| 22 Avr 2010 → 24 Avr 2010; Pavia, Italie |
| Sujets: Pixel sensors; 3D integration; 3D electronics |
| Page web: http://eil.unipv.it/MaKaC/conferenceDisplay.py?confId=0 |
| Sujets apparentés: Opto-électronique et technique d'affichage |
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| 13. | [ID=305898]SURM-APR10 — Use of reference materials and the estimation of measurement uncertainty |
| 27 Avr 2010 → 28 Avr 2010; Geel, Belgique |
| Résumé: This course provides participants with the theoretical basis for the estimation of measurement uncertainty and establishment of traceability. The course is intended for laboratory managers and practitioners in analytical laboratories who use reference materials for statistical quality control, method validation and calibration and need to assess measurement uncertainties on customer’s demand or as requirement of ISO 17025. |
| Sujets: training course, reference materials, measurement uncertainty, traceability, quality management |
| Page web: http://irmm.jrc.ec.europa.eu/html/events/index.htm |
| Sujets apparentés: Formation professionnelle continue en chimie |
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| 14. | [ID=337108]Recent Developments in Sensors and Applied Systems |
| 28 Avr 2010 → 30 Avr 2010; Gwalior , Madhya Pradesh, Inde |
| Organisateur: Department of Physics, Institute of Technology & Management, Gwalior M P India |
| Résumé: Sensor is a device which can respond to some properties of the environment and transform the response into an electric signal. History has shown that advancements in materials science and engineering have been important drivers in the development of sensor technologies. More recently, a new era in sensor technology was ushered in by the development of large-scale silicon processing, permitting the exploitation of silicon to create new methods for transducing physical phenomena into electrical output that can be readily processed by a computer. Ongoing developments in materials technology will permit better control of material properties and behavior, thereby offering possibilities for new sensors with advanced features, such as greater fidelity, lower cost and increased reliability. The seminar aims to discuss recent developments in sensors. This will provide opportunity to all researchers, engineers and industrialists to present recent scientific and technological results on all aspects of the theory, design, fabrication and application of sensor and applied systems, and promote exchange of ideas and techniques. |
| Page web: http://www.itmuniverse.in/ |
| Sujets apparentés: Physique de la matière condensée: Semi-conducteurs |
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| 15. | [ID=333344]BIW10 — 14th Beam Instrumentation Workshop |
| 02 Mai 2010 → 06 Mai 2010; Santa Fe, New Mexico, États-Unis |
| Page web: http://www.lanl.gov/conferences/biw10/ |
| Sujets apparentés: Accélérateurs de particules |
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| 16. | [ID=304626]RICH 2010 — 7th International Workshop On Ring Imaging Cherenkov Detectors |
| 03 Mai 2010 → 07 Mai 2010; Cassis, Provence, France |
| Page web: http://rich2010.in2p3.fr |
| Sujets apparentés: Physique des hautes énergies, des particules et des champs; Accélérateurs de particules |
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| 17. | [ID=304594]CALOR 2010 — 14th International Conference On Calorimetry In High Energy Physics |
| 10 Mai 2010 → 14 Mai 2010; Pékin, Chine |
| Page web: http://bes3.ihep.ac.cn/conference/calor2010/ |
| Sujets apparentés: Physique des hautes énergies, des particules et des champs; Accélérateurs de particules |
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| 18. | [ID=322385] 18th Topical Conference on High-Temperature Plasma Diagnostics |
| 16 Mai 2010 → 20 Mai 2010; Wildwood, NJ, États-Unis |
| Sujets: magnetic confinement fusion, inertial confinement fusion, space plasmas, astrophysics, and industrial applications to discuss mutual problems in the development of instrumentation and experimental techniques for the characterization of high-temperature plasmas. |
| Page web: http://htpd2010.pppl.gov/ |
| Sujets apparentés: Physique des plasmas |
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| 19. | [ID=344199]WMSN10 — Workshop on Metrology and Standards for Nanoelectronics: More than Moore Applications (WMSN-MtM) |
| 17 Mai 2010; Grenoble, France |
| Page web: http://www.nist.gov/eeel/semiconductor/mtm-workshop.cfm |
| Sujets apparentés: Électronique; Microtechnologie, nanotechnologie |
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| 20. | [ID=310864]SPIE Scanning Microscopy 2010 |
| 17 Mai 2010 → 19 Mai 2010; Monterey, Californie, États-Unis |
| Résumé: Scanning microscopy for forensics, food analysis, medical applications, and health and safety. |
| Page web: http://spie.org/x19036.xml |
| Contact: SPIE, PO Box 10, Bellingham, WA 98227-0010 US ; Tél.: ((360) 676-3290) |
| Sujets apparentés: Microscopie |
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| 21. | [ID=310841]Sensor & Test 2010 |
| 18 Mai 2010 → 20 Mai 2010; Nuremberg, Allemagne |
| Résumé: The SENSOR+TEST trade fair in Nuremberg is the leading forum for sensors, measuring and testing. From simple microsensors to complex test rigs, from ready-to-use components to individualized services, the SENSOR+TEST represents the complete competence in measurement technology. |
| Page web: http://www.sensor-test.de/page/en |
| Contact: AMA Service GmbH, Postfach 2352, D-31506 Wunstorf, Germany ; Tél.: (49 50 33 96 39 0) |
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| 22. | [ID=335918]Metrology 2010 |
| 18 Mai 2010 → 20 Mai 2010; Moscou, États-Unis |
| Page web: http://www.metrol.expoprom.ru/en/ |
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| 23. | [ID=311323]EMBO Workshop — Advanced Light Microscopy Techniques and their applications – 10th international ELMI meeting |
| 18 Mai 2010 → 21 Mai 2010; EMBL Heidelberg, Allemagne |
| Page web: http://www.embl.de/training/courses_conferences/conference/2010/FLM10-01/index.html |
| Sujets apparentés: Biologie moléculaire; Microscopie |
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| 24. | [ID=304874]Electron Backscatter Diffraction 2010 |
| 24 Mai 2010 → 26 Mai 2010; Madison, Wisc., États-Unis |
| Page web: http://www.microbeamanalysis.org/ebsd-2010 |
| Contact: J. Fournelle University of Wisconsin Madison, Department of Geoscience, 1215 W. Dayton St. Madison Wisc. U.S.A. 53706; Tél.: (+1-608-262-7964) |
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| 25. | [ID=322469]RT 2010 — 17th Real Time Conference: Computer Applications in Nuclear and Plasma Sciences |
| 24 Mai 2010 → 28 Mai 2010; Lisbonne, Portugal |
| Sujets: Ultra Fast Analog and Timing Converter and digitizer; Front- end Signal Processing; Reconfigurable hardware; Real Time System Architectures; Trigger and Data Acquisition; High Level Triggers; Event Building and Fast Networks; High Speed Synchronous Control; Online Processing Farms; Online Databases; Controls and Monitoring System; Emerging Real Time Technologies; New standards (ATCA). |
| Page web: http://iter.ipfn.ist.utl.pt/RT2010 |
| Contact: Real-time 2010, Instituto de Plasmas e Fusão Nuclear, Av. Rovisco Pais, 1049-001 Lisboa, Portugal; Tél.: (+351 21 841 7818) |
| Sujets apparentés: Evénement multidisciplinaires ou générales en informatique; Logiciels |
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| 26. | [ID=303991] Symposium on Radiation Measurements and Applications XII |
| 24 Mai 2010 → 28 Mai 2010; Ann Arbor, MI, États-Unis |
| Sujets: accelerator physics, applied ysics,astrophysics, atomic physics, biophysics, electronics, energy physics, environmental physics, fundamental constants, geophysics, high-energy physics, industrial physics, low temperature physics, measurement science technology, medical physics, nanotechnology, neutron physics, nuclear physics, optics and optoelectronics, particles and fields, photonics, physics of beams, radiation physics,r adiation protection, space physics, subatomic physics, synchrotron radiation. |
| Page web: http://rma-symposium.engin.umich.edu |
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| 27. | [ID=311201]WILGA — WILGA Symposium on Electronics and Photonics for High Energy Physics Experiments and FELs |
| 24 Mai 2010 → 30 Mai 2010; Wilga, Poland, Pologne |
| Sujets: LLRF systems; electronics and photonics for HEP; wide angle astronomy for GRB; E-XFEL; CMS trigger; Pierre Auger triggers; superconducting cavities; ILC |
| Page web: http://wilga.ise.pw.edu.pl |
| Contact: WILGA Resort owned by Warsaw University of Technology WILGA near Warsaw on Vistula River |
| Sujets apparentés: Accélérateurs de particules; Opto-électronique et technique d'affichage |
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| 28. | [ID=322488]TEMPMEKO — International Symposium on Humidity and Moisture (ISHM), and the International Symposium on Temperature and Thermal Measurements in Industry and Science |
| 31 Mai 2010 → 04 Jui 2010; Portoroz, Slovénie |
| Sujets: Fundamental Aspects and Standards: Thermodynamic Temperature Determinations; Temperature Scales; Fixed Points; Humidity and Moisture Standards. Standard Reference Materials for Humidity and Moisture Measurements: Water vapour pressure data; Interaction of Water Molecules with Gases, Liquids and Solids; Water activity of substances; Moisture profile and transport; Water vapour flux; Thermophysical Properties. Methods and Sensors: Thermoelectric Thermometry; Resistance Thermometry; Noise Thermometry; Acoustic Thermometry; Radiation Thermometry; Instrumentation; Hygrometers and Moisture Sensors. Traceability and Dissemination: Interlaboratory Comparisons; Calibration Procedures and Facilities; Uncertainty Estimation. Applications of temperature, humidity moisture and other thermal measurements: Control and Automation; Dynamic and Transient measurements; Industrial Processing Applications; Medical and Biological measurements; Environmental measurements; Climate and Weather Applications; Other applied measurements. |
| Page web: http://www.tempmeko-ishm.org |
| Contact: TEMPMEKO&ISHM 2010, University of Ljubljana Faculty of Electrical Engineering Laboratory of Metrology and Quality Trzaska 25, 1000 Ljubljana, Slovenia; Tél.: (+386 1 4768 224) |
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| 29. | [ID=337139]Nano Measure 2010 |
| 03 Jui 2010 → 04 Jui 2010; Cracovie, Pologne |
| Organisateur: Agilent Technologies |
| Résumé: Agilent Technologies is pleased to announce that the first annual Nano Measure scientific symposium, Nano Measure 2010, will take place June 3-4 at Jagiellonian University in Krakow, Poland. The two-day event will feature keynote speaker Emeritus Prof. Trevor Page of the School of Chemical Engineering and Advanced Materials, Newcastle University, England, as well as some of the most prestigious scientists presenting leading-edge, nano measurement-driven research. The event agenda comprises four applications-focused sessions: 1) In Situ Life Science Studies, Biomaterials & Single-Molecule Characterization at the Nanoscale; 2) Polymers -- Nanomorphology, Controlled Fabrication & Property Characterization; 3) Nanomechanical Properties of Organic & Inorganic Materials; and 4) Materials at the Nanoscale -- Imaging, Electrochemistry & Electrical Properties. |
| Page web: http://www.nano-measure.com/ |
| Sujets apparentés: Microtechnologie, nanotechnologie |
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| 30. | [ID=333307]Vertex 2010: 19th International Workshop On Vertex Detectors |
| 06 Jui 2010 → 11 Jui 2010; Loch Lomond, Glasgow, Scotland, Royaume-Uni |
| Page web: http://www.vertex2010.physics.gla.ac.uk/ |
| Sujets apparentés: Accélérateurs de particules |
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| 31. | [ID=327171]Lehigh Microscopy School |
| 06 Jui 2010 → 18 Jui 2010; Bethlehem, PA, États-Unis |
| Résumé: The Lehigh Microscopy School will be celebrating its 40th anniversary in June 2010. Considered to be the most comprehensive set of courses in electron and scanning probe microscopy in the world, the Lehigh Microscopy Schools have attracted more than 5,000 professionals from 50 states and 34 countries since its inception in 1970. During the two-week school, lecturers from the world’s leading research institutions and universities teach everything from basic to advanced microscopy. Course offerings include: Scanning Electron Microscopy and X-ray Microanalysis (June 7-11) Introduction to SEM and EDS for the New Operator (June 6) Scanning Probe Microscopy: From Fundamentals to Advanced Applications (June 14-17) Problem Solving with SEM, X-ray Microanalysis, and Electron Backscatter Patterns (June 14-18) Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques (June 14-18) Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications (June 14-17) Focused Ion Beam (FIB): Instrumentation and Applications (June 14-17) |
| Page web: http://www.lehigh.edu/microscopy/ |
| Sujets apparentés: Microscopie |
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| 32. | [ID=324176]IPRD10 — 12th Topical Seminar on Innovative Particle and Radiation Detectors |
| 07 Jui 2010 → 10 Jui 2010; Siena, Italie |
| Page web: http://www.bo.infn.it/sminiato/siena10.html |
| Sujets apparentés: Accélérateurs de particules; Radioprotection |
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| 33. | [ID=263542]Optical Remote Sensing of the Environment |
| 07 Jui 2010 → 10 Jui 2010; Tucson, États-Unis |
| Résumé: This would be a first in a series of meetings focusing on specific topics in optical remote sensing of the environment. The first would address the coastal ocean and watersheds, with sessions emphasizing the inter-disciplinary nature of the topic. Sessions will cover the state of the art in instruments and methods for exploiting data from imaging spectrometers (hyperspectral/multi-spectral) and LIDAR. Sessions on specific topics such as bathymetry, coastal mapping, biophysical/geophysical retrieval (land and water), and atmospheric correction to name a few will be presented |
| Contact: Khara Minter; Mél.: kminte@osa.org |
| Sujets apparentés: Optique et lasers; Physique de l'environnement |
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| 34. | [ID=263574]Applied Industrial Optics: Spectroscopy, Imaging & Metrology |
| 07 Jui 2010 → 10 Jui 2010; Tucson, États-Unis |
| Résumé: The proposed meeting will focus on advances in applied industrial optics. There will be three proposed topics: 1) Industrial Spectroscopy, 2)Industrial Imaging, and 3)Optical Metrology in Industry. Each topic will focus on applied technology that is currently utilized to enhance production, quality, and/or safety in an industrial setting. In addition, an attempt will be made to highlight current trends in applied optics that may have far reaching industrial implications. The meeting will draw from multiple industries to include: food & beverage, pharmaceutical, oil & gas, pulp & paper, chemical, biological, and defense. In addition, it is anticipated that the meeting attendance will be multidisciplinary |
| Page web: kminte@osa.org |
| Contact: Khara Minter |
| Sujets apparentés: Optique et lasers |
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| 35. | [ID=289209] 4th Japan - US Nondestructive Testing Symposium |
| 07 Jui 2010 → 11 Jui 2010; Maui, HI, États-Unis |
| Sujets: Aging Infrastructure NDE Advancements towards Technology Transfer Future Direction & Possibilities in NDE Probability of Detection with NDE Materials Characterization Synergies within NDE Prognostic Tools for NDE NDE Developments for Transportation Systems NDE Modeling and Signal Processing Automated NDE Performance Based NDT Certification Criteria Measurement Analysis Non-Linear Ultrasonic Safety and Reliability |
| Page web: http://www.asnt.org/events/conferences/jsndi/jsndi.htm |
| Contact: The American Society for Nondestructive Testing Abstract Submission - Conference Dept., PO Box 28518, Columbus, OH 43228-0518, US |
| Sujets apparentés: Energie nucléaire et déchets radioactifs; Ingénierie |
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| 36. | [ID=333062]Imaging 2010 — 4th International Conference on Imaging Techniques in Subatomic Physics, Astrophysics, Medicine and Biology |
| 08 Jui 2010 → 11 Jui 2010; Stockholm, Suède |
| Page web: http://www.mi.physics.kth.se/Imaging_2010/Imaging_2010/Home.html |
| Sujets apparentés: Mathématiques appliquées: Reconnaissance de formes et traitement d'image; Physique appliquée |
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| 37. | [ID=279515]Gordon Research Conference — Three Dimensional Electron Microscopy |
| 20 Jui 2010 → 25 Jui 2010; Lucca (Barga), Italie |
| Page web: http://www.grc.org/meetings.aspx?year=2010 |
| Sujets apparentés: Microscopie |
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| 38. | [ID=323378]ISSSR — 2010 Intl Symposium on Spectral Sensing Research |
| 21 Jui 2010 → 24 Jui 2010; Springfield, Missouri, États-Unis |
| Contact: Mél.: jim.jensen@us.army.mil |
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| 39. | [ID=269895]Short Course on Vibration Measurements by Laser and Noncontact Techniques |
| 22 Jui 2010; Ancona, Italie |
| Résumé: A one-day tutorial course will be organised by A.I.VE.LA.- the Italian Association of LAser VElocimetry and non invasive diagnostics at the premises of the Faculty of Engineering, Ancona, Italy. Aim of the course is to provide the fundamentals of Laser and Noncontact Techniques for Vibration Measurements and to offer hands-on experience on the most advanced instrumentation. The program of the Course will include: - theoretical lectures in the morning, held by leading personalities in the field - hands- on laboratory sessions in the afternoon. The day after the Course, the 9th edition of the Conference on Vibration Measurements by Laser and Noncontact Techniques will take place, offering participants the opportunity to confront with experts in the field. |
| Page web: http://www.aivela.org |
| Contact: Prof. E.P. Tomasini |
| Sujets apparentés: Optique et lasers; Ingénierie |
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| 40. | [ID=289247] 9th International Conference on Vibration Measurements by Laser and Non Contact Techniques |
| 22 Jui 2010 → 25 Jui 2010; Ancona, Italie |
| Page web: http://www.aivela.org/call9th.html |
| Contact: Università Politecnica delle Marche Via Brecce Bianche - 60131 Ancona, Italy |
| Sujets apparentés: Optique et lasers |
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| 41. | [ID=269896]9th Intl Conference on Vibration Measurements by Laser and Noncontact Techniques |
| 23 Jui 2010 → 25 Jui 2010; Ancona, Italie |
| Résumé: The 9th Intl Conference on Vibration Measurements by Laser and Noncontact Techniques will be held at the Faculty of Engineering, Ancona, Italy on 23- 25 June 2010. LANGUAGE: The official language of the Conference is English ABSTRACTS SUBMISSION: 6th February 2010 ABSTRACTS ACCEPTANCE: 28 February 2010 PAPERS SUBMISSION: 29 March 2010 EXHIBITION: An exhibition is planned to enable participating organizations to bring their products directly to the attention of potential customers. Leading manufacturers of laser vibrometer systems, non contact instrumentation and systems for vibro-acoustic testing will exhibit. SHORT COURSE: the day before the Conference, a one-day tutorial course will be held in order to provide the fundamentals of Laser and Noncontact Techniques for Vibration Measurements and to offer hands-on experience on the most advanced instrumentation. |
| Page web: http://www.aivela.org |
| Contact: Prof. E.P. Tomasini |
| Sujets apparentés: Optique et lasers; Ingénierie |
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| 42. | [ID=267977]SPIE Astronomical Telescopes and Instrumentation |
| 27 Jui 2010 → 02 Jul 2010; San Diego, Californie, États-Unis |
| Page web: http://spie.org/x1375.xml |
| Sujets apparentés: Opto-électronique et technique d'affichage; Astronomie, astrophysique et cosmologie |
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| 43. | [ID=327560]MICROSCIENCE 2010 |
| 28 Jui 2010 → 01 Jul 2010; Londres, Royaume-Uni |
| Organisateur: Royal Microscopcial Society |
| Résumé: MICROSCIENCE 2010 is Europe's leading event for microscopy, analysis and imaging. The conference has three parallel Themes of Life, Materials and Frontiers. |
| Page web: http://www.microscience2010.org.uk/ |
| Sujets apparentés: Microscopie |
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| 44. | [ID=312530]IFES 2010 — 52nd International Field Emission Symposium |
| 05 Jul 2010 → 08 Jul 2010; Sydney, Australie |
| Résumé: We invite you to attend the International Field Emission Symposium as it comes to Australia for the first time. The inspiring scientific program focusing on high field nanoscience and atom probe microscopy will include plenary sessions, the IFES Bloch Lecture, EW Muller Award, international keynote lectures and pre-symposium workshops. IFES 2010 will foster the exchange of ideas and create a stimulating environment in which to collaborate with like-minded colleagues and to learn from experts in the field. We invite abstracts from any aspect of high-field nanoscience and atom probe microscopy. |
| Sujets: nanotechnology, nanoscience, atom probe, microscopy, microanalysis, high field, field emission, symposium, Ringer, Muller, IFES, science, scientific, Sydney, ifes 2010, ifes2010, international field emission symposium |
| Page web: http://www.ifes2010.org/default.asp |
| Sujets apparentés: Microscopie |
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| 45. | [ID=330071] International Laser Radar Conference |
| 05 Jul 2010 → 09 Jul 2010; St. Petersburg, Russie |
| Page web: http://ilrc25.iao.ru/ |
| Contact: Tél.: (+7 3822 491865) |
| Sujets apparentés: Optique et lasers |
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| 46. | [ID=105628]EMU School: High-resolution electron microscopy of minerals |
| 07 Jul 2010 → 11 Jul 2010; Nancy, France |
| Page web: http://www.lcm3b.uhp-nancy.fr/emu10/ |
| Sujets apparentés: Microscopie; Cours et événements pour étudiants en physique |
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| 47. | [ID=279842]Gordon Research Conference — Signaling By Adhesion Receptors |
| 11 Jul 2010 → 16 Jul 2010; Colby College, Waterville, ME, États-Unis |
| Page web: http://www.grc.org/meetings.aspx?year=2010 |
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| 48. | [ID=322659] 12th International Conference on Nuclear Microprobe Technology and Applications |
| 26 Jul 2010 → 30 Jul 2010; Leipzig, Allemagne |
| Page web: http://www.uni-leipzig.de/~exph2/ |
| Contact: Dr T. Reinert Institut fuer Experimentelle Physik II, Fakultaet fuer Physik und Geowissenshaften, Universitaet Leipzig, Linnestrasse 5, 04103 Leipzig, Germany; Tél.: (+49 341 97 32650) |
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| 49. | [ID=304892]Annual Meeting of the Microbeam Analysis Society (MAS)and the Microscopy Society of America (MSA) |
| 01 Aou 2010 → 05 Aou 2010; Portland, Oreg., États-Unis |
| Contact: N. Guy 11260 Roger Bacon Drive, Suite 500 Reston Va. U.S.A. 20190; Tél.: (+1-703-964-1240 ext14); Mél.: nicoleguy@conferencemanagers.com |
| Sujets apparentés: Microscopie |
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| 50. | [ID=322601]SLOPOS 12 — 12th International Workshop on Slow Positron Beam Techniques |
| 01 Aou 2010 → 06 Aou 2010; Magnetic Island, Australie |
| Page web: http://www.positron.edu.au/slopos12/ |
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| 51. | [ID=311065]NIWeek 2010 |
| 03 Aou 2010 → 05 Aou 2010; Austin, TX, États-Unis |
| Résumé: NIWeek 2010, the 16th annual customer and technology conference, opens August 3 at the Austin Convention Center in Austin, Texas, for three days of interactive technical sessions, targeted summits, hands-on workshops, and exhibitions on the latest developments for design, control, automation, manufacturing, and test. |
| Page web: http://www.ni.com/niweek/ |
| Contact: National Instruments Corporation, 11500 N Mopac Expwy., Austin, TX 78759-3504 US ; Tél.: ((800) 531-5066) |
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| 52. | [ID=332142]IMEKO — 13th IMEKO TC1-TC7 Joint Symposium (Measurements in Biology and Medicine) |
| 01 Sep 2010 → 03 Sep 2010; Londres, Royaume-Uni |
| Page web: http://www.iop.org/Conferences/y/10/IMEKO/index.html |
| Sujets apparentés: Physique appliquée: Biophysique |
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| 53. | [ID=250121]4th European Workshop on Optical Fibre Sensors |
| 08 Sep 2010 → 10 Sep 2010; Porto, Portugal |
| Résumé: Following the successful Workshops in Peebles (1998), Santander (2004) and Napoli (2007) we at Porto have the privilege to organise the fourth edition of the European Workshop on Optical Fibre Sensors, EWOFS'2010. This initiative is aimed at promoting a scientific meeting with a high level of participants interaction that will enable the open debate and the assessment of new concepts, technologies and applications in the domain of optical fibre sensors, as well as the establishment of new collaborations and networks. EWOFS'2010 intends also to complement in time and geographical location the international conferences in this area, particularly the International Conference on Optical Fibre Sensors. |
| Page web: http://www.ewofs.org/ |
| Contact: Jose Luis Santos |
| Sujets apparentés: Opto-électronique et technique d'affichage; Optique et lasers |
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| 54. | [ID=341631]Theoretische Grundlagen, Instrumentation und Anwendungen der Schwingungsspektroskopie (Raman, Mittel-Infrarot und Nah-Infrarot) für die Materialwissenschaft |
| 14 Sep 2010 → 16 Sep 2010; Essen, Allemagne |
| Résumé: Ziel der Veranstaltung ist die Erarbeitung der theoretischen und instrumentellen Grundlagen und der praktischen Anwendungsmöglichkeiten der modernen Schwingungsspektroskopie. Der Fokus auf “real-life“ Beispiele wird dabei helfen, die am besten geeignete der drei diskutierten Techniken für individuelle Probleme auszuwählen. Die Teilnahme an dem Kurs wird auch dazu befähigen, die Vor- und Nachteile der Schwingungsspektroskopie im Vergleich zu anderen analytischen Verfahren besser abzuschätzen und verfügbare schwingungsspektroskopische Daten effizienter auszuwerten. Inhalt: Der Kurs liefert einen Überblick über die theoretischen Grundlagen und den letzten Stand der Gerätetechnik (einschließlich Bildgebungsverfahren) für die Schwingungsspektroskopie (Raman, Mittel-Infrarot, Nah-Infrarot). Weiterhin wird ein breites Spektrum von Anwendungsbeispielen für die chemische und physikalische Analyse von Feststoffen, Flüssigkeiten und Gasen diskutiert. Probenpräparation und mögliche Artefakte (und deren Vermeidung) werden im Detail behandelt und die qualitative und quantitative Analyse werden sowohl für univariate als auch für multivariate, chemometrische Auswertealgorithmen besprochen. Die Behandlung praktischer Applikationen für die chemische, pharmazeutische, kosmetische, Polymer- und Lebensmittel-Industrie sowie für Umweltfragen wird die Relevanz dieser spektroskopischen Techniken für die Materialforschung sowie für die Qualitäts- und Reaktionskontrolle illustrieren. Zielgruppe: Chemiker, Physiker, Chemie-/Physik-Ingenieure und Labor-Techniker der chemischen, pharmazeutischen, Polymer- und Lebensmittel-Industrie Kursleitung: Prof. Dr. Heinz Wilhelm Siesler |
| Page web: http://www.gdch.de/vas/fortbildung/kurse/fortbildung2010.htm#2503 |
| Contact: Gesellschaft Deutscher Chemiker e.V. Postfach 90 04 40 60444 Frankfurt am Main Deutschland; Tél.: (+49 69 7917-364/-291) |
| Sujets apparentés: Physique de la matière condensée et des matériaux; Photochimie et spectroscopie |
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| 55. | [ID=324020]HP2.3: High Precision For Hard Processes At The LHC |
| 14 Sep 2010 → 17 Sep 2010; Florence, Italie |
| Page web: http://theory.fi.infn.it/HP23 |
| Sujets apparentés: Accélérateurs de particules |
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| 56. | [ID=343923]IMC17 — International Microscopy Congress |
| 19 Sep 2010 → 24 Sep 2010; Rio de Janeiro, Brésil |
| Résumé: The International Microscopy Congress (IMC) held every four years under the auspices of International Federation of Societies for Microscopy (IFSM) has been providing an international forum for the state of the art of microscopy at the frontiers of research and applications in Materials Sciences and in Life Sciences. The Brazilian Society for Microscopy and Microanalysis (SBMM) is proud and happy to host the IMC17. |
| Page web: http://www.imc-17.com/ |
| Sujets apparentés: Microscopie |
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| 57. | [ID=311061]SPIE Remote Sensing 2010 |
| 20 Sep 2010 → 23 Sep 2010; Toulouse, France |
| Résumé: The SPIE Remote Sensing Symposium has become the largest and most prestigious annual international meeting on this subject in Europe with more than 600 attendees and each year sees comprehensive coverage of scientific topics, applications, sensors, systems, and satellite platforms and more than 25 countries are represented. Co-located with the SPIE European Symposium on Defence & Security, this event will provide an excellent opportunity to explore new opportunities to collaborate with new partners from other related fields of activity. |
| Page web: http://spie.org/remote-sensing-europe.xml?WT.mc_id=Cal-ERS |
| Contact: SPIE, PO Box 10, Bellingham, WA 98227 US ; Tél.: ((360) 676-3290) |
| Sujets apparentés: Opto-électronique et technique d'affichage |
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| 58. | [ID=341592]Universelle Bearbeitung von Photoelektronenspektren (XPS, ESCA) für die quantitative Oberflächenanalyse - Einführungskurs für qualifizierte Mitarbeiter |
| 04 Oct 2010 → 05 Oct 2010; Leipzig, Allemagne |
| Résumé: Ziel des Kurses ist die Vermittlung von Kenntnissen über die zuverlässige Oberflächen- und Dünnschichtanalyse mit Hilfe von Photoelektronenspektren. Es wird gezeigt, auf welche Weise spektrale Intensitätsverteilungen optimal bearbeitet, Steuer- und Bewertungsgrößen eines Peakfits richtig interpretiert und Spektrometerfunktionen korrekt berücksichtigt werden können. Ein Übungsprogramm soll Anwender mit der Verwendung von Datenbanken zur Identifizierung von chemischen Verschiebungen, mit der Serienbearbeitung von parameterabhängigen Messreihen, mit Datenexport, Grafikpräsentationen sowie mit einer praktischen Fehleranalyse vertraut machen. Inhalt: Schwerpunkte des Kurses sind: - Erklärung der spektralen Information - ESCA-Anwendungsbeispiele in der Materialanalyse - mathematische Modellierung der Photoelektronenspektren - Analyse und Diskussion von Fehlern des Peakfits - Einfluss der Spektrometer-Transmissionsfunktion - Übungen mit einer nutzerfreundlichen universellen Spektrenbearbeitungs-, Analyse- und Präsentationssoftware - Beratung zur Serienbearbeitung parameterabhängiger Messreihen, zu Datenexport und zur Ergebnispräsentation Zielgruppe: Anwender der Elektronenspektroskopie (Analytiker, Chemiker, Physiker, Ingenieure und Techniker) aus Forschungseinrichtungen und Industrielabors, die sich mit der quantitativen Analyse der Zusammensetzung und dem chemischen Zustand von Festkörperoberflächen und Dünnschichten befassen Kursleitung: Prof. Dr. Rüdiger Szargan |
| Page web: http://www.gdch.de/vas/fortbildung/kurse/fortbildung2010.htm#2363 |
| Contact: Gesellschaft Deutscher Chemiker e.V. Postfach 90 04 40 60444 Frankfurt am Main Deutschland; Tél.: (+49 69 7917-364/-291) |
| Sujets apparentés: Physique atomique et moléculaire; Physique de la matière condensée et des matériaux |
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| 59. | [ID=309570]REMOTE'10 — 6th WSEAS Int.Conf. on REMOTE SENSING |
| 04 Oct 2010 → 06 Oct 2010; Iwate Prefectural University , Japon |
| Organisateur: World Scientific and Engineering Academy and Society (WSEAS) |
| Page web: http://www.wseas.us/conferences/2010/japan/remote/ |
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| 60. | [ID=341599]Röntgenbeugung und Rietveldanalyse - Grundlagen und Anwendung in Industrie und Forschung |
| 04 Oct 2010 → 07 Oct 2010; Bremen, Allemagne |
| Résumé: Die Rietveldmethode wird primär für quantitative Phasenanalysen und Kristallstrukturverfeinerungen eingesetzt, mit wachsendem Erfolg aber auch zur Bestimmung von Kristallitgrößen, Mikrospannungen und Stapelfehlordnungen. Ziel des Kurses ist es, dass Absolventen die Methode selbstständig anwenden und ihre Ergebnisse beurteilen können. Die notwendigen Grundlagen in Röntgenbeugung und Kristallographie werden im Kurs aufgefrischt. Ziel der großzügig anberaumten Übungen ist, einen sicheren Umgang mit der Rietveldsoftware zu erlernen und ihre Möglichkeiten und Grenzen auszuloten. Inhalt: Schwerpunkte des Kurses sind: - Vermeidung systematischer Fehler bei der Messung von Daten - Korrektur unvermeidbarer systematischer Fehler in den Daten - Auffrischung der erforderlichen kristallographischen und kristallchemischen Grundkenntnisse - Kristallstrukturmodelle, Reflexprofilmodelle und ihre Parameter - Parameteroptimierung und Verfeinerungsstrategie - Beurteilung von Verfeinerungsergebnissen - Bedienung der Rietveldsoftware - Phasen-Quantifizierung mit und ohne Strukturmodell und ihre Fallen - Kristallit- und Partikelgrößen, Mikroverzerrungen: Bestimmung und Bestimmungsgrenzen - Darstellung von Kristallstrukturen - Optional: Ergänzung von Kristallstrukturmodellen mit Fouriersynthesen - Großer Übungsteil, in dem bereitgestellte oder - nach vorheriger Rücksprache - eigene Daten bearbeitet werden können Zielgruppe: Praxisorientierter Einführungskurs für Chemiker, Pharmazeuten, Mineralogen, Geo- und Materialwissenschaftler in Industrie und Forschung Kursleitung: Dr. Johannes Birkenstock |
| Page web: http://www.gdch.de/vas/fortbildung/kurse/fortbildung2010.htm#2302 |
| Contact: Gesellschaft Deutscher Chemiker e.V. Postfach 90 04 40 60444 Frankfurt am Main Deutschland; Tél.: (+49 69 7917-364/-291) |
| Sujets apparentés: Physique appliquée: Rayonnement synchrotron et rayons X, cristallographie |
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| 61. | [ID=343563]INSINUME 2010 — 5th International Symposium on In Situ Nuclear Metrology as a Tool for Radioecology |
| 20 Nov 2010 → 23 Nov 2010; Dubna, Russie |
| Sujets: New technologies and methodologies applied to measurements of radionuclides in situ and in the laboratory. Transfer of radionuclides in terrestrial and aquatic ecosystems; assessment of exposure to man and ecosystem Management of environmental crises related to nuclear accidents including social and economic aspects. Safety standards for radiation protection of the public and the environment; assessment and quality management. Development of national and international databases for their exchange among scientists and information to the general public. Mapping and modeling of radioactive contamination using GIS-technologies. Utilization of nuclear and non-nuclear wastes: new technologies, policy and legislation of the European Union. |
| Page web: http://insinume2010.jinr.ru/ |
| Contact: INSINUME 2010, Joint Institute for Nuclear Research, Dubna Moscow Region 141980, Russian Federation; Tél.: (+74962165609) |
| Sujets apparentés: Physique nucléaire |
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| 62. | [ID=323024] 3rd Workshop on Precision Physics and Fundamental Physical Constants |
| 07 Dec 2010 → 10 Dec 2010; St. Petersburg, Russie |
| Page web: http://www.ioffe.rssi.ru/evpti_09.html |
| Sujets apparentés: Histoire et philosophie de la physique |
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| 63. | [ID=333412]NDIP 2011 — 6th International Conference On New Developments In Photodetection |
| 04 Jul 2011 → 08 Jul 2011; Lyon, France |
| Page web: http://www.ndip.fr |
| Sujets apparentés: Accélérateurs de particules |
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