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Meetings/Workshops on Metrology and Instrumentation in Poland

Conference-Service.com offers, as part of our business activities, a directory of upcoming scientific and technical meetings. The calendar is published for the convenience of conference participants and we strive to support conference organisers who need to publish their upcoming events. Although great care is being taken to ensure the correctness of all entries, we cannot accept any liability that may arise from the presence, absence or incorrectness of any particular information on this website. Always check with the meeting organizer before making arrangements to participate in an event!

Meeting organizers can submit meetings free of charge for inclusion into the listing.

1.go to top of page[ID=311267]WILGA — WILGA Symposium on Electronics and Photonics for High Energy Physics Experiments and FELs
24 May 2010 → 30 May 2010; Wilga, Poland, Poland
topics: LLRF systems; electronics and photonics for HEP; wide angle astronomy for GRB; E-XFEL; CMS trigger; Pierre Auger triggers; superconducting cavities; ILC
weblink: http://wilga.ise.pw.edu.pl
contact: WILGA Resort owned by Warsaw University of Technology WILGA near Warsaw on Vistula River
related subject(s): Particle Accelerators; Photonics, Optoelectronics and Display Devices
2.go to top of page[ID=337106]Nano Measure 2010
03 Jun 2010 → 04 Jun 2010; Cracow, Poland
organizer: Agilent Technologies

abstract: Agilent Technologies is pleased to announce that the first annual Nano Measure scientific symposium, Nano Measure 2010, will take place June 3-4 at Jagiellonian University in Krakow, Poland. The two-day event will feature keynote speaker Emeritus Prof. Trevor Page of the School of Chemical Engineering and Advanced Materials, Newcastle University, England, as well as some of the most prestigious scientists presenting leading-edge, nano measurement-driven research.

The event agenda comprises four applications-focused sessions: 1) In Situ Life Science Studies, Biomaterials & Single-Molecule Characterization at the Nanoscale; 2) Polymers -- Nanomorphology, Controlled Fabrication & Property Characterization; 3) Nanomechanical Properties of Organic & Inorganic Materials; and 4) Materials at the Nanoscale -- Imaging, Electrochemistry & Electrical Properties.

weblink: http://www.nano-measure.com/
related subject(s): Microtechnology, Nanotechnology

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last updated: 07 March 2010