Conference-Service.com offers, as part of our business activities, a directory of upcoming scientific and technical meetings. The calendar is published for the convenience of conference participants and we strive to support conference organisers who need to publish their upcoming events.
Although great care is being taken to ensure the correctness of all entries, we cannot accept any liability that may arise from the presence, absence or incorrectness of any particular information on this website. Always check with the meeting organizer before making arrangements to participate in an event!
| 3. | [ID=269875]Novel Techniques in Microscopy |
| 11 Apr 2010 → 15 Apr 2010; Miami, United States |
| abstract: The Novel Techniques in Microscopy Meeting aims at bringing together communities such as lighting, computer graphics, color technologists, optical designers, light sources and virtual reality towards the common goal of design, production and understanding of ambient lighting and a lit model's appearance. |
| contact: OSA Customer Service; email: custserv@osa.org |
| related subject(s): Optics and Lasers; Microscopy |
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| 4. | [ID=297575]Surface Analysis comprehensive short courses |
| 19 Apr 2010 → 23 Apr 2010; Dayton, Ohio, United States |
| abstract: This five-day set of short courses on the two major electron spectroscopy techniques, Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS/ESCA) is designed for scientists, engineers, technicians, and students, who would like a detailed understanding of the uses of AES, XPS/ESCA, and Data Processing for surface analysis and depth profiling. The courses can be taken as a 5-day package or individually. |
| weblink: http://www.surfaceanalysis.org/schedule.html |
| related subject(s): Condensed Matter Physics and Materials |
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| 5. | [ID=333366]BIW10 — 14th Beam Instrumentation Workshop |
| 02 May 2010 → 06 May 2010; Santa Fe, New Mexico, United States |
| weblink: http://www.lanl.gov/conferences/biw10/ |
| related subject(s): Particle Accelerators |
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| 6. | [ID=322396] 18th Topical Conference on High-Temperature Plasma Diagnostics |
| 16 May 2010 → 20 May 2010; Wildwood, NJ, United States |
| topics: magnetic confinement fusion, inertial confinement fusion, space plasmas, astrophysics, and industrial applications to discuss mutual problems in the development of instrumentation and experimental techniques for the characterization of high-temperature plasmas. |
| weblink: http://htpd2010.pppl.gov/ |
| related subject(s): Plasma and Gas-discharge Physics |
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| 7. | [ID=310864]SPIE Scanning Microscopy 2010 |
| 17 May 2010 → 19 May 2010; Monterey, California, United States |
| abstract: Scanning microscopy for forensics, food analysis, medical applications, and health and safety. |
| weblink: http://spie.org/x19036.xml |
| contact: SPIE, PO Box 10, Bellingham, WA 98227-0010 US ; phone: ((360) 676-3290) |
| related subject(s): Microscopy |
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| 8. | [ID=335841]Metrology 2010 |
| 18 May 2010 → 20 May 2010; Moscow, United States |
| weblink: http://www.metrol.expoprom.ru/en/ |
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| 9. | [ID=304929]Electron Backscatter Diffraction 2010 |
| 24 May 2010 → 26 May 2010; Madison, Wisc., United States |
| weblink: http://www.microbeamanalysis.org/ebsd-2010 |
| contact: J. Fournelle University of Wisconsin Madison, Department of Geoscience, 1215 W. Dayton St. Madison Wisc. U.S.A. 53706; phone: (+1-608-262-7964) |
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| 10. | [ID=304046] Symposium on Radiation Measurements and Applications XII |
| 24 May 2010 → 28 May 2010; Ann Arbor, MI, United States |
| topics: accelerator physics, applied ysics,astrophysics, atomic physics, biophysics, electronics, energy physics, environmental physics, fundamental constants, geophysics, high-energy physics, industrial physics, low temperature physics, measurement science technology, medical physics, nanotechnology, neutron physics, nuclear physics, optics and optoelectronics, particles and fields, photonics, physics of beams, radiation physics,r adiation protection, space physics, subatomic physics, synchrotron radiation. |
| weblink: http://rma-symposium.engin.umich.edu |
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| 11. | [ID=327193]Lehigh Microscopy School |
| 06 Jun 2010 → 18 Jun 2010; Bethlehem, PA, United States |
| abstract: The Lehigh Microscopy School will be celebrating its 40th anniversary in June 2010. Considered to be the most comprehensive set of courses in electron and scanning probe microscopy in the world, the Lehigh Microscopy Schools have attracted more than 5,000 professionals from 50 states and 34 countries since its inception in 1970. During the two-week school, lecturers from the world’s leading research institutions and universities teach everything from basic to advanced microscopy. Course offerings include: Scanning Electron Microscopy and X-ray Microanalysis (June 7-11) Introduction to SEM and EDS for the New Operator (June 6) Scanning Probe Microscopy: From Fundamentals to Advanced Applications (June 14-17) Problem Solving with SEM, X-ray Microanalysis, and Electron Backscatter Patterns (June 14-18) Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques (June 14-18) Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications (June 14-17) Focused Ion Beam (FIB): Instrumentation and Applications (June 14-17) |
| weblink: http://www.lehigh.edu/microscopy/ |
| related subject(s): Microscopy |
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| 12. | [ID=263564]Optical Remote Sensing of the Environment |
| 07 Jun 2010 → 10 Jun 2010; Tucson, United States |
| abstract: This would be a first in a series of meetings focusing on specific topics in optical remote sensing of the environment. The first would address the coastal ocean and watersheds, with sessions emphasizing the inter-disciplinary nature of the topic. Sessions will cover the state of the art in instruments and methods for exploiting data from imaging spectrometers (hyperspectral/multi-spectral) and LIDAR. Sessions on specific topics such as bathymetry, coastal mapping, biophysical/geophysical retrieval (land and water), and atmospheric correction to name a few will be presented |
| contact: Khara Minter; email: kminte@osa.org |
| related subject(s): Optics and Lasers; Environmental Physics |
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| 13. | [ID=263541]Applied Industrial Optics: Spectroscopy, Imaging & Metrology |
| 07 Jun 2010 → 10 Jun 2010; Tucson, United States |
| abstract: The proposed meeting will focus on advances in applied industrial optics. There will be three proposed topics: 1) Industrial Spectroscopy, 2)Industrial Imaging, and 3)Optical Metrology in Industry. Each topic will focus on applied technology that is currently utilized to enhance production, quality, and/or safety in an industrial setting. In addition, an attempt will be made to highlight current trends in applied optics that may have far reaching industrial implications. The meeting will draw from multiple industries to include: food & beverage, pharmaceutical, oil & gas, pulp & paper, chemical, biological, and defense. In addition, it is anticipated that the meeting attendance will be multidisciplinary |
| weblink: kminte@osa.org |
| contact: Khara Minter |
| related subject(s): Optics and Lasers |
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| 14. | [ID=289143] 4th Japan - US Nondestructive Testing Symposium |
| 07 Jun 2010 → 11 Jun 2010; Maui, HI, United States |
| topics: Aging Infrastructure NDE Advancements towards Technology Transfer Future Direction & Possibilities in NDE Probability of Detection with NDE Materials Characterization Synergies within NDE Prognostic Tools for NDE NDE Developments for Transportation Systems NDE Modeling and Signal Processing Automated NDE Performance Based NDT Certification Criteria Measurement Analysis Non-Linear Ultrasonic Safety and Reliability |
| weblink: http://www.asnt.org/events/conferences/jsndi/jsndi.htm |
| contact: The American Society for Nondestructive Testing Abstract Submission - Conference Dept., PO Box 28518, Columbus, OH 43228-0518, US |
| related subject(s): Nuclear Energy and Radwaste; Engineering (general) |
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| 15. | [ID=323323]ISSSR — 2010 Intl Symposium on Spectral Sensing Research |
| 21 Jun 2010 → 24 Jun 2010; Springfield, Missouri, United States |
| contact: email: jim.jensen@us.army.mil |
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| 16. | [ID=267922]SPIE Astronomical Telescopes and Instrumentation |
| 27 Jun 2010 → 02 Jul 2010; San Diego, California, United States |
| weblink: http://spie.org/x1375.xml |
| related subject(s): Photonics, Optoelectronics and Display Devices; Astronomy, Astrophysics and Cosmology |
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| 17. | [ID=279886]Gordon Research Conference — Signaling By Adhesion Receptors |
| 11 Jul 2010 → 16 Jul 2010; Colby College, Waterville, ME, United States |
| weblink: http://www.grc.org/meetings.aspx?year=2010 |
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| 18. | [ID=304892]Annual Meeting of the Microbeam Analysis Society (MAS)and the Microscopy Society of America (MSA) |
| 01 Aug 2010 → 05 Aug 2010; Portland, Oreg., United States |
| contact: N. Guy 11260 Roger Bacon Drive, Suite 500 Reston Va. U.S.A. 20190; phone: (+1-703-964-1240 ext14); email: nicoleguy@conferencemanagers.com |
| related subject(s): Microscopy |
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| 19. | [ID=311021]NIWeek 2010 |
| 03 Aug 2010 → 05 Aug 2010; Austin, TX, United States |
| abstract: NIWeek 2010, the 16th annual customer and technology conference, opens August 3 at the Austin Convention Center in Austin, Texas, for three days of interactive technical sessions, targeted summits, hands-on workshops, and exhibitions on the latest developments for design, control, automation, manufacturing, and test. |
| weblink: http://www.ni.com/niweek/ |
| contact: National Instruments Corporation, 11500 N Mopac Expwy., Austin, TX 78759-3504 US ; phone: ((800) 531-5066) |
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