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Meetings/Workshops on Condensed Matter Physics: Semiconductors in France

Conference-Service.com offers, as part of our business activities, a directory of upcoming scientific and technical meetings. The calendar is published for the convenience of conference participants and we strive to support conference organisers who need to publish their upcoming events. Although great care is being taken to ensure the correctness of all entries, we cannot accept any liability that may arise from the presence, absence or incorrectness of any particular information on this website. Always check with the meeting organizer before making arrangements to participate in an event!

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1.	[ID=82100]Training Course — Growth and Structural Characterization of Semiconductor Nanostructures (FIB-TEM)
	01 Sep 2009 → 14 Sep 2009; Grenoble, France
	abstract: Epitaxial growth of III-N compounds, Molecular Beam Epitaxy (MBE), X-Ray characterization using Synchrotron radiation (in particular grazing incidence diffraction, grazing incidence small angle X-Rays scattering (GISAXS) and Anomalous Diffraction), Characterization at the monolayer scale of deformation profile using MEIS (Medium energy ion scattering), Quantitative analysis of High Resolution Transmission Electron Microscopy (HRTEM) images, Raman spectroscopy of nanostructrures. The lectures will be followed by practical training in MBE, Xray diffraction and MEIS.
	weblink: http://www.prominas.eu/Training-Courses-TC-4.html
	related subject(s): Applied Physics: Microtechnology, Nanotechnology; Courses and Events for Physics Students

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last updated: 22 September 2007