Conference-Service.com offers, as part of our business activities, a directory of upcoming scientific and technical meetings. The calendar is published for the convenience of conference participants and we strive to support conference organisers who need to publish their upcoming events.
Although great care is being taken to ensure the correctness of all entries, we cannot accept any liability that may arise from the presence, absence or incorrectness of any particular information on this website. Always check with the meeting organizer before making arrangements to participate in an event!
| 3. |  [ID=41740]2008 IEEE Nuclear Science Symposium (NSS) And Medical Imaging Conference (MIC) And 16th International Workshop On Room-TemperatureSemiconductor X-Ray And Gamma-Ray Detectors (RTSD) |
| 18 Oct 2008 → 25 Oct 2008; Dresden, Germany |
| weblink: http://www.nss-mic.org/2008/ |
| related subject(s): Nuclear Physics; Nuclear Medicine and Radiology |
| |
| 4. | [ID=120140] International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors |
| 20 Nov 2008 → 24 Nov 2008; Dresden, Germany |
| topics: Semiconductor Materials for Radiation Detection; Crystal Growth, Materials and Defects Characterization; Strip, Pixel and Discrete Semiconductor Detectors; Properties of Electrical Contacts and Device Technology; Radiation Damage, Long-Term Stability and Environmental Effects; Scintillator/Semiconductor Array Hybrids; Semiconductor Neutron Detectors; Detector/ASIC Hybridization, Interconnects and Electronics; Spectrometer Systems for Homeland Security, Nuclear Inspections Safeguards and Portal Monitoring; Imaging Systems for Medical, Astrophysics, Non-Destructive Testing and Cargo Monitoring Applications. |
| weblink: http://www.nss-mic.org/2008/NSSMain.asp |
| contact: RTSD Co-Chair, Freiburger Materialforschungszentrum, Stefan-Meier-Straße 21 79104 Freiburg , Germany; phone: (+49 (0) 761 203 4775) |
| related subject(s): Metrology and Instrumentation |
| |
| 5. | [ID=196325]EOS Conference on Frontiers in Electronic Imaging |
| 15 Jun 2009 → 17 Jun 2009; Munich, Germany |
| abstract: This conference, organized by the European Optical Society, is part of the upcoming World of Photonics Congress, co-located with the LASER.World of Photonics Exhibition. Synopsis: Expectations are that during the year 2009, in every second more than 30 solid-state image sensors will be produced world-wide. Soon our world will have more cameras than people. No doubt: Electronic imaging is omnipresent! It addresses scientists and engineers in electronic imaging R&D, users of imaging solutions who demand the highest performance from their equipment for their particular application, interested professionals from all segments of academia and industry where imaging is significant, and all technically-oriented persons who would like to know where electronic imaging is heading. |
| topics: "Application-specific image sensors (using smart pixels and related approaches)", "High-performance real-time 3D imaging", "Electronic imaging with novel materials" and, last, but not least, "Single-photon, solid-state image sensing". |
| weblink: http://www.myeos.org/MUNICH2009 |
| related subject(s): Applied Physics: Photonics, Optoelectronics and Display Devices |
| |
| 6. | [ID=196335]EOS Conference on Manufacturing of Optical Components |
| 15 Jun 2009 → 17 Jun 2009; Munich, Germany |
| abstract: This conference, organized by the European Optical Society, is part of the upcoming World of Photonics Congress, co-located with the LASER.World of Photonics Exhibition. Synopsis: The EOS Conference on "Manufacturing of Optical Components" will give an overview of the state-of-the-art of fabrication technologies, and will provide, among other things, an international platform for discussing manufacturability of optical components as well as ongoing scientific research projects and, last but not least, future trends and prospective developments. Sub-conferences will be: Precise Optics Fabrication - Micro-optics and Structured Surface Technologies - High Volume Manufacturing of Optical Components - Metrology of Advanced Optics (This is a joint session between EOS and SPIE Europe) |
| topics: "Precise Optics Fabrication", "Micro-optics and Structured Surface Technologies", "High Volume Manufacturing of Optical Components", "Metrology of Advanced Optics" |
| weblink: http://www.myeos.org/MUNICH2009 |
| related subject(s): Applied Physics: Photonics, Optoelectronics and Display Devices; Electronics and Electrical Engineering |
| |
